Ashkan Olyaei
at Univ of Toronto
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 October 2005 Paper
Proceedings Volume 5969, 596927 (2005) https://doi.org/10.1117/12.629237
KEYWORDS: Wavelets, Feature extraction, Pattern recognition, Sensors, Quantization, Imaging systems, Image processing, Very large scale integration, Computer architecture, Wavelet transforms

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