We show that metrology at the working wavelength is possible with a wave front sensor in the Mid-Infrared range (MWIR, 3-5µm). We demonstrate the implementation of an Interband Cascade Laser for double-pass optical qualification with a quadriwave lateral shearing interferometer. To avoid any parasitic interference fringes, which limit the phase accuracy, we modulate the diode driving current with an external analog signal. While the power stability is kept constant, the phase noise is reduced and no artefact limits the measurement accuracy.
The demand for large coated flat and curved optics is growing for applications in automotive (windshields, LIDAR windows) or space (spectrally resolved imaging, FSO Lasercom). Their large size leading to high Transmitted wavefront error (TWE) and their sensitivity to wavelength require new metrology instruments. We propose measuring the TWE of such optics with a quadriwave lateral shearing interferometer (QLSI) based wave front sensor, in a double-pass configuration. We present the instrument ability to measure optics in their full transmission spectral band. We also discuss the best strategy to characterize large TWE optics in dynamic ranges exceeding tens of microns.
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