Mr. Robert MacDonald Profile

Robert MacDonald

Principal Optical Engineer at L3Harris Technologies Inc

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 27 April 1995 Paper

Measuring the line spacing and density of high-resolution images from capstan and drum output scanners

Robert MacDonald

Proceedings Volume 2413, (1995) https://doi.org/10.1117/12.207585

KEYWORDS: Signal detection, Scanners, Microscopes, Diffraction gratings, Cameras, Sensors, Fiber lasers, Visualization, Motion controllers, Optical design

Read Abstract +

Minor defects in line spacing and/or density variations can cause visual artifacts in images generated by output scanners. This paper presents a method to quantify such errors using a measurement station that characterizes both the line spacing and the relative density of lines printed at 1200 to 2400 lines/inch. While other measurement methods exist (e.g., grabbing single frames of data from a micro-densitometer), possibly most restricting is the limited number of lines that can be measured due to the trade-off between field of view and resolution. Moire effects may also be utilized for spacing checks, but the results are not sufficiently quantized. The method being presented does not limit the number of lines that can be measured at one time, therefore large regions can be used to perform spatial frequency analysis. In 1- on/1-off line patterns, variations of only 2-3% in line spacing (approximately equals 40 microinches in 1200 LPI) are perceptible. Very minor variations in density can also cause visual artifacts. Distinguishing between a spacing error and a density error is critical to the troubleshooting process. This measurement system was designed to have a theoretical positional resolution of 0.417 microinches. Repeatability of line space measurements for this type of pattern is typically better than 10 microinches.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years