Prof. Bongtae Han Profile

Prof. Bongtae Han

Professor at Univ of Maryland College Park

SPIE Involvement:

Author

Publications (8)

SPIE Journal Paper | 1 October 2009

In situ measurement of gas diffusion properties of polymeric seals used in MEMS packages by optical gas leak testing

Changsoo Jang, Arindam Goswami, Bongtae Han, Suk-Jin Ham

JM3, Vol. 8, Issue 04, 043025, (October 2009) https://doi.org/10.1117/12.10.1117/1.3227904

KEYWORDS: Diffusion, Polymers, Microelectromechanical systems, In situ metrology, Optical testing, Fringe analysis, Calibration, Helium, Interferometry, Finite element methods

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Proceedings Article | 9 February 2009 Paper

In situ measurement of gas diffusion properties of sealing polymers for MEMS packages by an optical gas leak test

Changsoo Jang, Arindam Goswami, Bongtae Han

Proceedings Volume 7206, 720607 (2009) https://doi.org/10.1117/12.810001

KEYWORDS: Polymers, Diffusion, Optical testing, Microelectromechanical systems, Fringe analysis, Helium, Calibration, Interferometry, Oxygen, Temperature metrology

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Proceedings Article | 9 February 2009 Paper

Fine leak batch testing of multiple MEMS packages

Changsoo Jang, Byeng Dong Youn, Suk-Jin Ham, Bongtae Han

Proceedings Volume 7206, 720605 (2009) https://doi.org/10.1117/12.810004

KEYWORDS: Helium, Data modeling, Microelectromechanical systems, Diffusion, Inspection, Spectroscopy, Analytical research, Molecules, Palladium, Error analysis

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SPIE Journal Paper | 1 February 2005

Contrast of shadow moiré at high-order Talbot distances

Changwoon Han, Bongtae Han

OE, Vol. 44, Issue 02, 028002, (February 2005) https://doi.org/10.1117/12.10.1117/1.1849221

KEYWORDS: Cameras, Diffraction, Fringe analysis, Diffraction gratings, Optical engineering, Moire patterns, Distance measurement, Light sources, Ronchi rulings, Imaging systems

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SPIE Journal Paper | 1 April 2004

Infrared diffraction interferometer for coplanarity measurement of high-density solder bump pattern

Michael Mello, Bongtae Han, Zhaoyang Wang

OE, Vol. 43, Issue 04, (April 2004) https://doi.org/10.1117/12.10.1117/1.1666861

KEYWORDS: Diffraction, Wavefronts, Interferometry, Interferometers, Infrared radiation, Diffraction gratings, Visible radiation, Surface roughness, Reflectivity, Infrared lasers

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SPIE Journal Paper | 1 September 2001

Sensitivity enhancement of far-infrared Fizeau interferometry by digital image processing

Kaushal Verma, Bongtae Han

OE, Vol. 40, Issue 09, (September 2001) https://doi.org/10.1117/12.10.1117/1.1391436

KEYWORDS: Fringe analysis, Reflectivity, Interferometry, Error analysis, Silicon, Reflection, Digital image processing, Optical engineering, Aluminum, Mirrors

SPIE Journal Paper | 1 July 1992

Higher sensitivity moire interferometry for micromechanics studies

Bongtae Han

OE, Vol. 31, Issue 07, (July 1992) https://doi.org/10.1117/12.10.1117/12.57681

KEYWORDS: Moire patterns, Deflectometry, Composites, Interferometers, Interfaces, Calibration, Phase shifts, Actuators, Microelectronics, Fringe analysis

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Proceedings Article | 1 December 1991 Paper

Ultrahigh-sensitivity moire interferometry

Bongtae Han

Proceedings Volume 1554, (1991) https://doi.org/10.1117/12.57424

KEYWORDS: Moire patterns, Deflectometry, Interferometers, Composites, Fringe analysis, Calibration, Mechanics, Interfaces, Actuators, Holographic interferometry

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Showing 5 of 8 publications

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