Mr. Christo Janse van Rensburg Profile

Christo Janse van Rensburg

Research Engineer at INSiAVA

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Publications (5)

Proceedings Article | 8 March 2014 Paper

Characteristics of avalanche electroluminescent nanoscale Si light sources in SOI technology

Christo Janse van Rensburg, Monuko du Plessis, Petrus Venter

Proceedings Volume 8990, 89900K (2014) https://doi.org/10.1117/12.2039617

KEYWORDS: Light sources, Silicon, Light, Visible radiation, Doping, Quantum efficiency, Monte Carlo methods, Silicon photonics, Optical testing, Oxidation

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Proceedings Article | 25 February 2014 Paper

All-CMOS night vision viewer with integrated microdisplay

Marius Goosen, Petrus Venter, Monuko du Plessis, Nicolaas Faure, Christo Janse van Rensburg, Pieter Rademeyer

Proceedings Volume 9005, 900506 (2014) https://doi.org/10.1117/12.2039641

KEYWORDS: Night vision, Silicon, Imaging systems, CMOS technology, Near infrared, LCDs, Image processing, Scanning electron microscopy, Visible radiation, Video

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Proceedings Article | 6 March 2013 Paper

Nanoscale SOI silicon light source design for improved efficiency

Petrus Venter, Monuko du Plessis, Alfons Bogalecki, Christo Janse van Rensburg

Proceedings Volume 8628, 86280A (2013) https://doi.org/10.1117/12.2004235

KEYWORDS: Silicon, Light sources, Doping, Luminescence, Light, Arsenic, CMOS technology, Optics manufacturing, Optical communications, Oxidation

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Proceedings Article | 1 March 2013 Paper

A CMOS microdisplay with integrated controller utilizing improved silicon hot carrier luminescent light sources

Petrus Venter, Antonie Alberts, Monuko du Plessis, Trudi-Heleen Joubert, Marius Goosen, Christo Janse van Rensburg, Pieter Rademeyer, Nicolaas Fauré

Proceedings Volume 8643, 864309 (2013) https://doi.org/10.1117/12.2004277

KEYWORDS: Light sources, Silicon, Video, Digital electronics, Eye, Clocks, Electroluminescence, Luminescence, Integrated optics, Integrated circuits

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Proceedings Article | 2 February 2012 Paper

Spectral characteristics of electroluminescent silicon CMOS light emitters

Alfons Bogalecki, Monuko du Plessis, Petrus Venter, Christo Janse van Rensburg

Proceedings Volume 8266, 82660S (2012) https://doi.org/10.1117/12.907923

KEYWORDS: Light sources, Silicon, Temperature metrology, Electroluminescence, Near infrared, Diffusion, Light, Optical testing, Integrated optics, Quantum efficiency

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