Dr. Christophe Stolz
Researcher at Univ de Bourgogne
SPIE Involvement:
Author
Publications (20)

Proceedings Article | 28 July 2023 Paper
Camille Taglione, Carlos M. Mateo, Christophe Stolz
Proceedings Volume 12749, 127490I (2023) https://doi.org/10.1117/12.2690812
KEYWORDS: Sensors, Pose estimation, Visualization, RGB color model, Information visualization, Education and training, Point clouds, Data modeling, Machine learning, Image segmentation

SPIE Journal Paper | 9 October 2020
Abir Zanzouri Kechiche, Olivier Aubreton, Alexandre Mathieu, Antoine Mannucci, Christophe Stolz
OE, Vol. 59, Issue 10, 100501, (October 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.10.100501
KEYWORDS: Polarimetry, Metals, Oxides, Particles, Liquids, Image segmentation, Polarization, Solids, Optical engineering, Scanning electron microscopy

Proceedings Article | 16 July 2019 Paper
A. Zanzouri Kechiche, O. Aubreton, A. Mathieu, C. Stolz
Proceedings Volume 11172, 1117215 (2019) https://doi.org/10.1117/12.2521681
KEYWORDS: Polarimetry, Image segmentation, Polarization, Liquids, Metals, Plasma, Image filtering, 3D modeling, Solids, Remote sensing

Proceedings Article | 14 May 2017 Paper
A. Zanzouri Kechiche, O. Aubreton, A. Mathieu, C. Stolz
Proceedings Volume 10338, 103380Q (2017) https://doi.org/10.1117/12.2266940
KEYWORDS: Polarization, Polarimetry, Stereoscopy, 3D image processing, Far infrared, Near infrared, Metals, 3D metrology, Dielectric polarization, Cameras, Glasses, 3D modeling, Infrared radiation, Polarizers

Proceedings Article | 29 April 2016 Paper
Proceedings Volume 9896, 98960P (2016) https://doi.org/10.1117/12.2229931
KEYWORDS: Polarization, Polarimetry, Imaging systems, 3D metrology, Reflection, Inspection, Distortion, 3D modeling, Light sources and illumination, Refractive index, Machine vision, Dielectric polarization, Cameras, Polarizers, Wave plates

Showing 5 of 20 publications
Conference Committee Involvement (4)
Image Processing: Machine Vision Applications VIII
10 February 2015 | San Francisco, California, United States
Image Processing: Machine Vision Applications VII
3 February 2014 | San Francisco, California, United States
Image Processing: Machine Vision Applications VI
5 February 2013 | Burlingame, California, United States
Image Processing: Machine Vision Applications V
25 January 2012 | Burlingame, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top