Coen van Baren
Senior Design & Systems Engineer at SRON Netherlands Institute for Space Research
SPIE Involvement:
Author
Publications (49)

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12679, 1267902 (2023) https://doi.org/10.1117/12.2678522
KEYWORDS: Mirrors, X-ray optics, Spatial resolution, X-rays, Optical coatings, X-ray telescopes, Silicon, X-ray technology, Telescopes, Compliance

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12679, 1267903 (2023) https://doi.org/10.1117/12.2678106
KEYWORDS: Mirrors, Silicon, X-ray optics, Semiconducting wafers, Wafer-level optics, X-rays, Synchrotron radiation, Ion beam finishing, Mirror surfaces, Laser cutting

Proceedings Article | 12 July 2023 Open Access Paper
Proceedings Volume 12777, 127770Q (2023) https://doi.org/10.1117/12.2688840
KEYWORDS: Design and modelling, Mirrors, X-rays, Astronomical imaging, Ultraviolet radiation, Telescopes, Manufacturing, Equipment, Silicon, Collimators

Proceedings Article | 12 July 2023 Open Access Paper
Proceedings Volume 12777, 127770R (2023) https://doi.org/10.1117/12.2689003
KEYWORDS: Mirrors, Silicon, X-rays, Semiconducting wafers, Optics manufacturing, X-ray optics, Robots, Astronomical imaging, Wafer-level optics, Space mirrors

Proceedings Article | 31 August 2022 Presentation + Paper
Proceedings Volume 12181, 121810U (2022) https://doi.org/10.1117/12.2630775
KEYWORDS: Mirrors, Semiconducting wafers, Silicon, X-rays, Robots, X-ray optics, Wafer-level optics, Synchrotron radiation, Optical fabrication, Optical coatings

Proceedings Article | 31 August 2022 Poster + Paper
F. Zwart, R. Tacken, J. J. in't Zand, R. de la Rie, M. Limpens, C. Kochanowski, G. Aitink-Kroes, C. van Baren, J. Bayer, D. Baudin, F. Ceraudo, Y. Evangelista, M. Feroci, M. Frericks, J.-L. Gálvez, O. Gevin, M. Hernanz, A. Hormaetxe, P. Laubert, A. Meuris, J. Nab, J. Neelis, C. Tenzer, C. Vogel, G. Zampa
Proceedings Volume 12181, 1218167 (2022) https://doi.org/10.1117/12.2629406
KEYWORDS: Sensors, Electronics, Cameras, Adhesives, Silicon, Hybrid circuits, Spatial resolution, Manufacturing, Electrons, Temperature metrology

Proceedings Article | 31 August 2022 Presentation + Paper
Proceedings Volume 12181, 121810T (2022) https://doi.org/10.1117/12.2629894
KEYWORDS: Mirrors, X-ray optics, Spatial resolution, X-rays, Silicon, Optical testing, X-ray technology, Collimation, Optical fabrication, Laser cutting

Proceedings Article | 31 August 2022 Presentation + Paper
Margarita Hernanz, Søren Brandt, Jean in't Zand, Yuri Evangelista, Aline Meuris, Chris Tenzer, Gianluigi Zampa, Piotr Orleanski, Emrah Kalemci, Müberra Sungur, Stéphane Schanne, Frans Zwart, Rob de la Rie, Phillip Laubert, Coen van Baren, Gabby Aitink-Kroes, Lucien Kuiper, Jörg Bayer, Paul Hedderman, Samuel Pliego, Hao Xiong, Riccardo Campana, Ettore Del Monte, Marco Feroci, Francesco Ceraudo, Olivier Gevin, Irfan Kuvvetli, Denis Tcherniak, Konrad Skup, Malgorzata Michalska, Witold Nowosielski, Ander Hormaetxe, José-Luis Gálvez, Patrícia Ferrés, Alessandro Patruno, Walter Bonvicini, Matias Antonelli, Mirko Boezio, Daniela Cirrincione, Riccardo Munini, Alexandre Rachevski, Andrea Vacchi, Nicola Zampa, Irina Rashevskaya, Andrea Argan, Onur Turhan, Ayhan Bozkurt, Ahmet Onat, Enrico Bozzo, Andrea Santangelo, Shuang-Nan Zhang, Fangjun Lu, Yupeng Xu
Proceedings Volume 12181, 121811Y (2022) https://doi.org/10.1117/12.2628335
KEYWORDS: Cameras, Sensors, X-rays, Spatial resolution, Space operations, Image resolution, Stars, Observatories, X-ray imaging, Silicon

Proceedings Article | 17 September 2021 Presentation + Paper
Proceedings Volume 11822, 1182208 (2021) https://doi.org/10.1117/12.2594171
KEYWORDS: Mirrors, Tolerancing, Confocal microscopy, Mirror structures, Ear, X-ray optics, Epoxies, Silicon, Point spread functions, Optical alignment

Proceedings Article | 3 September 2021 Presentation + Paper
Proceedings Volume 11822, 1182207 (2021) https://doi.org/10.1117/12.2594234
KEYWORDS: Coating, Mirrors, Silicon, Semiconducting wafers, Photoresist materials, Optics manufacturing, Reflectivity, Inspection, Photography, Packaging

Proceedings Article | 31 August 2021 Presentation + Paper
Proceedings Volume 11822, 1182206 (2021) https://doi.org/10.1117/12.2593505
KEYWORDS: Mirrors, X-ray optics, X-rays, Robots, X-ray telescopes, Silicon, Semiconducting wafers, Wafer-level optics, Coating

Proceedings Article | 23 August 2021 Presentation + Paper
Proceedings Volume 11822, 1182209 (2021) https://doi.org/10.1117/12.2594230
KEYWORDS: Mirrors, X-ray optics, X-rays, Space operations, Silicon, Remote sensing, Mirror structures, X-ray telescopes, X-ray characterization, Optical testing

Proceedings Article | 23 August 2021 Presentation + Paper
Proceedings Volume 11822, 1182205 (2021) https://doi.org/10.1117/12.2594689
KEYWORDS: Mirrors, X-ray optics, X-rays, Spatial resolution, X-ray technology, Silicon, Observatories, Collimation, Telescopes, Optics manufacturing

Proceedings Article | 11 June 2021 Open Access Presentation + Paper
Proceedings Volume 11852, 118521Z (2021) https://doi.org/10.1117/12.2599339

Proceedings Article | 11 June 2021 Open Access Presentation + Paper
Proceedings Volume 11852, 1185220 (2021) https://doi.org/10.1117/12.2599341

Proceedings Article | 30 October 2019 Presentation + Paper
Proceedings Volume 11119, 111190E (2019) https://doi.org/10.1117/12.2530941
KEYWORDS: Mirrors, Silicon, Manufacturing, X-ray optics, Optics manufacturing, X-rays, Semiconducting wafers, Reflectivity, Metals

Proceedings Article | 8 October 2019 Presentation + Paper
Proceedings Volume 11119, 111190K (2019) https://doi.org/10.1117/12.2530866
KEYWORDS: Silicon, X-ray optics, Mirrors, Space operations, X-ray telescopes, High energy astrophysics, X-rays, Observatories, Spatial resolution, Mirror stabilization

Proceedings Article | 12 September 2019 Paper
Proceedings Volume 11119, 111190L (2019) https://doi.org/10.1117/12.2530696
KEYWORDS: Silicon, Wafer-level optics, X-ray optics, Semiconducting wafers, Lightweight mirrors, Mirrors, X-ray telescopes, Spatial resolution, Gamma radiation, Biomedical optics

Proceedings Article | 10 September 2019 Paper
Proceedings Volume 11119, 111190J (2019) https://doi.org/10.1117/12.2530706
KEYWORDS: Mirrors, Confocal microscopy, Silicon, X-ray technology, X-ray optics, X-rays, Mirror structures, Observatories, Synchrotron radiation

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11119, 111190D (2019) https://doi.org/10.1117/12.2530912
KEYWORDS: X-ray optics, Silicon, Telescopes, High energy astrophysics, Space observatories, Semiconductors, Materials processing, Robotic systems, Manufacturing, Systems modeling

Proceedings Article | 12 July 2019 Open Access Paper
Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Luc Voruz, Sjoerd Verhoex, Ljubiša Babić, Roy van der Hoeven, Kim van Straeten, Abdel Chatbi, David Girou, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Ivo Ferreira, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Jan-Joost Lankwarden, Coen van Baren, Alexander Eigenraam, Jan Willem den Herder, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Desiree Della Monica Ferreira, Finn Christensen, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball, Karl-Heinz Zuknik, Dervis Vernani
Proceedings Volume 11180, 1118023 (2019) https://doi.org/10.1117/12.2535994
KEYWORDS: Mirrors, Silicon, X-rays, Coating, Reflectivity, X-ray optics, Semiconducting wafers, Spatial resolution, Robots, Coating equipment

Proceedings Article | 18 July 2018 Presentation + Paper
Maximilien Collon, Giuseppe Vacanti, Nicolas Barriere, Boris Landgraf, Ramses Guenther, Mark Vervest, Roy van der Hoeven, Abdel Chatbi, David Girou, Jessica Sforzini, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Jeroen Haneveld, Karin Booysen, Arenda Koelewijn, Maurice Wijnperlé, Coen van Baren, Alexander Eigenraam, Peter Müller, Michael Krumrey, Vadim Burwitz, Daniele Spiga, Giovanni Pareschi, Sonny Massahi, Finn Christensen, Desiree Della Monica Ferreira, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball, Karl-Heinz Zuknik
Proceedings Volume 10699, 106990Y (2018) https://doi.org/10.1117/12.2314479
KEYWORDS: Silicon, Mirrors, X-ray optics, X-rays, Observatories, Spatial resolution

Proceedings Article | 6 July 2018 Paper
Proceedings Volume 10699, 106990X (2018) https://doi.org/10.1117/12.2313296
KEYWORDS: Mirrors, X-ray optics, X-rays, Spatial resolution, Coating, Titanium, Silicon, Metrology, Optical fabrication, Synchrotron radiation

Proceedings Article | 20 November 2017 Open Access Paper
Proceedings Volume 10564, 105640H (2017) https://doi.org/10.1117/12.2309138

Proceedings Article | 13 October 2017 Presentation + Paper
Proceedings Volume 10399, 103990G (2017) https://doi.org/10.1117/12.2274298
KEYWORDS: Mirrors, Silicon, Annealing, X-ray optics, Failure analysis, Space telescopes, X-rays, Space mirrors, Multilayers, Climatology

Proceedings Article | 29 August 2017 Paper
Proceedings Volume 10399, 103990B (2017) https://doi.org/10.1117/12.2274776
KEYWORDS: Telescopes, X-ray optics, Silicon, X-ray telescopes, X-ray astronomy, X-rays, High energy astrophysics, Semiconductors, Spatial resolution, Mirrors

Proceedings Article | 29 August 2017 Presentation + Paper
Maximilien Collon, Giuseppe Vacanti, Nicolas Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Roy van der Hoeven, Danielle Dekker, Abdel Chatbi, David Girou, Jessica Sforzini, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Coen van Baren, Alexander Eigenraam, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Finn Christensen, Desirée Della Monica Ferreira, Giuseppe Valsecchi, Paul Oliver, Ian Checquer, Kevin Ball, Karl-Heinz Zuknik
Proceedings Volume 10399, 103990C (2017) https://doi.org/10.1117/12.2273704
KEYWORDS: Mirrors, X-ray optics, Silicon, Optics manufacturing, Wafer-level optics, X-ray astronomy, Semiconducting wafers, Astronomical imaging, X-ray telescopes, Spatial resolution

Proceedings Article | 17 August 2016 Paper
Maximilien Collon, Giuseppe Vacanti, Ramses Günther, Alex Yanson, Nicolas Barriere, Boris Landgraf, Mark Vervest, Abdelhakim Chatbi, Roy van der Hoeven, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Brian Shortt, Jeroen Haneveld, Arenda Koelewijn, Coen van Baren, Alexander Eigenraam, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Paolo Conconi, Sonny Massahi, Finn Christensen, Giuseppe Valsecchi
Proceedings Volume 9905, 990528 (2016) https://doi.org/10.1117/12.2234427
KEYWORDS: X-ray optics, Silicon, X-ray telescopes, Semiconducting wafers, Mirrors, X-rays, Robots, Coating, Space telescopes, Spatial resolution

Proceedings Article | 25 July 2016 Paper
M. Feroci, E. Bozzo, S. Brandt, M. Hernanz, M. van der Klis, L.-P. Liu, P. Orleanski, M. Pohl, A. Santangelo, S. Schanne, L. Stella, T. Takahashi, H. Tamura, A. Watts, J. Wilms, S. Zane, S.-N. Zhang, S. Bhattacharyya, I. Agudo, M. Ahangarianabhari, C. Albertus, M. Alford, A. Alpar, D. Altamirano, L. Alvarez, L. Amati, C. Amoros, N. Andersson, A. Antonelli, A. Argan, R. Artigue, B. Artigues, J.-L. Atteia, P. Azzarello, P. Bakala, D. Ballantyne, G. Baldazzi, M. Baldo, S. Balman, M. Barbera, C. van Baren, D. Barret, A. Baykal, M. Begelman, E. Behar, O. Behar, T. Belloni, F. Bernardini, G. Bertuccio, S. Bianchi, A. Bianchini, P. Binko, P. Blay, F. Bocchino, M. Bode, P. Bodin, I. Bombaci, J.-M. Bonnet Bidaud, S. Boutloukos, F. Bouyjou, L. Bradley, J. Braga, M. Briggs, E. Brown, M. Buballa, N. Bucciantini, L. Burderi, M. Burgay, M. Bursa, C. Budtz-Jørgensen, E. Cackett, F. Cadoux, P. Cais, G. Caliandro, R. Campana, S. Campana, X. Cao, F. Capitanio, J. Casares, P. Casella, A. Castro-Tirado, E. Cavazzuti, Y. Cavechi, S. Celestin, P. Cerda-Duran, D. Chakrabarty, N. Chamel, F. Château, C. Chen, Y. Chen, J. Chenevez, M. Chernyakova, J. Coker, R. Cole, A. Collura, M. Coriat, R. Cornelisse, L. Costamante, A. Cros, W. Cui, A. Cumming, G. Cusumano, B. Czerny, A. D'Aì, F. D'Ammando, V. D'Elia, Z. Dai, E. Del Monte, A. De Luca, D. De Martino, J. P. C. Dercksen, M. De Pasquale, A. De Rosa, M. Del Santo, S. Di Cosimo, N. Degenaar, J. W. den Herder, S. Diebold, T. Di Salvo, Y. Dong, I. Donnarumma, V. Doroshenko, G. Doyle, S. Drake, M. Durant, D. Emmanoulopoulos, T. Enoto, M. H. Erkut, P. Esposito, Y. Evangelista, A. Fabian, M. Falanga, Y. Favre, C. Feldman, R. Fender, H. Feng, V. Ferrari, C. Ferrigno, M. Finger, G. Fraser, M. Frericks, M. Fullekrug, F. Fuschino, M. Gabler, D. K. Galloway, J. L. Gálvez Sanchez, P. Gandhi, Z. Gao, E. Garcia-Berro, B. Gendre, O. Gevin, S. Gezari, A. B. Giles, M. Gilfanov, P. Giommi, G. Giovannini, M. Giroletti, E. Gogus, A. Goldwurm, K. Goluchová, D. Götz, L. Gou, C. Gouiffes, P. Grandi, M. Grassi, J. Greiner, V. Grinberg, P. Groot, M. Gschwender, L. Gualtieri, M. Guedel, C. Guidorzi, L. Guy, D. Haas, P. Haensel, M. Hailey, K. Hamuguchi, F. Hansen, D. Hartmann, C. A. Haswell, K. Hebeler, A. Heger, M. Hempel, W. Hermsen, J. Homan, A. Hornstrup, R. Hudec, J. Huovelin, D. Huppenkothen, S. Inam, A. Ingram, J. In't Zand, G. Israel, K. Iwasawa, L. Izzo, H. Jacobs, F. Jetter, T. Johannsen, P. Jenke, P. Jonker, J. Josè, P. Kaaret, K. Kalamkar, E. Kalemci, G. Kanbach, V. Karas, D. Karelin, D. Kataria, L. Keek, T. Kennedy, D. Klochkov, W. Kluzniak, E. Koerding, K. Kokkotas, S. Komossa, S. Korpela, C. Kouveliotou, A. Kowalski, I. Kreykenbohm, L. Kuiper, D. Kunneriath, A. Kurkela, I. Kuvvetli, F. La Franca, C. Labanti, D. Lai, F. Lamb, C. Lachaud, P. Laubert, F. Lebrun, X. Li, E. Liang, O. Limousin, D. Lin, M. Linares, D. Linder, G. Lodato, F. Longo, F. Lu, N. Lund, T. Maccarone, D. Macera, S. Maestre, S. Mahmoodifar, D. Maier, P. Malcovati, J. Malzac, C. Malone, I. Mandel, V. Mangano, A. Manousakis, M. Marelli, J. Margueron, M. Marisaldi, S. Markoff, A. Markowitz, A. Marinucci, A. Martindale, G. Martínez, I. McHardy, G. Medina-Tanco, M. Mehdipour, A. Melatos, M. Mendez, S. Mereghetti, S. Migliari, R. Mignani, M. Michalska, T. Mihara, M. C. Miller, J. M. Miller, T. Mineo, G. Miniutti, S. Morsink, C. Motch, S. Motta, M. Mouchet, G. Mouret, J. Mulačová, F. Muleri, T. Muñoz-Darias, I. Negueruela, J. Neilsen, T. Neubert, A. Norton, M. Nowak, A. Nucita, P. O'Brien, M. Oertel, P. E. H. Olsen, M. Orienti, M. Orio, M. Orlandini, J. Osborne, R. Osten, F. Ozel, L. Pacciani, F. Paerels, S. Paltani, M. Paolillo, I. Papadakis, A. Papitto, Z. Paragi, J. Paredes, A. Patruno, B. Paul, F. Pederiva, E. Perinati, A. Pellizzoni, A. V. Penacchioni, U. Peretz, M. Perez, M. Perez-Torres, B. Peterson, V. Petracek, C. Pittori, J. Pons, J. Portell, A. Possenti, K. Postnov, J. Poutanen, M. Prakash, I. Prandoni, H. Le Provost, D. Psaltis, J. Pye, J. Qu, D. Rambaud, P. Ramon, G. Ramsay, M. Rapisarda, A. Rashevski, I. Rashevskaya, P. Ray, N. Rea, S. Reddy, P. Reig, M. Reina Aranda, R. Remillard, C. Reynolds, L. Rezzolla, M. Ribo, R. de la Rie, A. Riggio, A. Rios, D. Rischke, P. Rodríguez-Gil, J. Rodriguez, R. Rohlfs, P. Romano, E. M. Rossi, A. Rozanska, A. Rousseau, B. Rudak, D. Russell, F. Ryde, L. Sabau-Graziati, T. Sakamoto, G. Sala, R. Salvaterra, D. Salvetti, A. Sanna, J. Sandberg, T. Savolainen, S. Scaringi, J. Schaffner-Bielich, H. Schatz, J. Schee, C. Schmid, M. Serino, N. Shakura, S. Shore, J. Schnittman, R. Schneider, A. Schwenk, A. Schwope, A. Sedrakian, J.-Y. Seyler, A. Shearer, A. Slowikowska, M. Sims, A. Smith, D. Smith, P. Smith, M. Sobolewska, V. Sochora, P. Soffitta, P. Soleri, L. Song, A. Spencer, A. Stamerra, B. Stappers, R. Staubert, A. Steiner, N. Stergioulas, A. Stevens, G. Stratta, T. Strohmayer, Z. Stuchlik, S. Suchy, V. Suleimanov, F. Tamburini, T. Tauris, F. Tavecchio, C. Tenzer, F. Thielemann, A. Tiengo, L. Tolos, F. Tombesi, J. Tomsick, G. Torok, J. M. Torrejon, D. F. Torres, E. Torresi, A. Tramacere, I. Traulsen, A. Trois, R. Turolla, S. Turriziani, S. Typel, P. Uter, P. Uttley, A. Vacchi, P. Varniere, S. Vaughan, S. Vercellone, M. Vietri, F. Vincent, V. Vrba, D. Walton, J. Wang, Z. Wang, S. Watanabe, R. Wawrzaszek, N. Webb, N. Weinberg, H. Wende, P. Wheatley, R. Wijers, R. Wijnands, M. Wille, C. Wilson-Hodge, B. Winter, S. Walk, K. Wood, S. Woosley, X. Wu, R. Xu, W. Yu, F. Yuan, W. Yuan, Y. Yuan, G. Zampa, N. Zampa, L. Zampieri, L. Zdunik, A. Zdziarski, A. Zech, B. Zhang, C. Zhang, S. Zhang, M. Zingale, F. Zwart
Proceedings Volume 9905, 99051R (2016) https://doi.org/10.1117/12.2233161
KEYWORDS: X-rays, Stars, Sensors, Observatories, Physics, Astronomy, Cameras, Roads, Collimators, Astrophysics

Proceedings Article | 18 July 2016 Paper
Proceedings Volume 9905, 990527 (2016) https://doi.org/10.1117/12.2233037
KEYWORDS: X-rays, X-ray optics, X-ray technology, Space telescopes, Silicon, X-ray optics, Telescopes, X-ray technology, Semiconductors, Mirrors, Metrology, Optics manufacturing

Proceedings Article | 4 September 2015 Paper
Eric Wille, Marcos Bavdaz, Tim Oosterbroek, Maximilien Collon, Marcelo Ackermann, Ramses Günther, Giuseppe Vacanti, Mark Vervest, Alexei Yanson, Coen van Baren, Jeroen Haneveld, Arenda Koelewijn, Anne Leenstra, Maurice Wijnperle, Giovanni Pareschi, Marta Civitani, Paolo Conconi, Daniele Spiga, Giuseppe Valsecchi, Fabio Marioni, Karl-Heinz Zuknik, Mario Schweitzer
Proceedings Volume 9603, 96030L (2015) https://doi.org/10.1117/12.2187486
KEYWORDS: Mirrors, Silicon, Manufacturing, Telescopes, X-ray telescopes, Space telescopes, X-ray optics, Semiconducting wafers, Silica, Observatories

Proceedings Article | 4 September 2015 Paper
Marcos Bavdaz, Eric Wille, Brian Shortt, Sebastiaan Fransen, Maximilien Collon, Giuseppe Vacanti, Ramses Günther, Alexei Yanson, Mark Vervest, Jeroen Haneveld, Coen van Baren, Karl-Heinz Zuknik, Finn Christensen, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Giuseppe Valsecchi
Proceedings Volume 9603, 96030J (2015) https://doi.org/10.1117/12.2188074
KEYWORDS: Mirrors, X-ray optics, X-rays, Telescopes, Silicon, Metrology, X-ray telescopes, Optical benches, X-ray technology, Sensors

Proceedings Article | 4 September 2015 Paper
Maximilien Collon, Giuseppe Vacanti, Ramses Günther, Alex Yanson, Nicolas Barrière, Boris Landgraf, Mark Vervest, Abdelhakim Chatbi, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Jeroen Haneveld, Arenda Koelewijn, Anne Leenstra, Maurice Wijnperle, Coen van Baren, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Paolo Conconi, Finn Christensen
Proceedings Volume 9603, 96030K (2015) https://doi.org/10.1117/12.2188988
KEYWORDS: Silicon, Mirrors, X-rays, Semiconducting wafers, Spatial resolution, X-ray optics, Wafer-level optics, Metrology, Reflection, Polishing

Proceedings Article | 31 July 2014 Paper
M. Feroci, J. W. den Herder, E. Bozzo, D. Barret, S. Brandt, M. Hernanz, M. van der Klis, M. Pohl, A. Santangelo, L. Stella, A. Watts, J. Wilms, S. Zane, M. Ahangarianabhari, C. Albertus, M. Alford, A. Alpar, D. Altamirano, L. Alvarez, L. Amati, C. Amoros, N. Andersson, A. Antonelli, A. Argan, R. Artigue, B. Artigues, J.-L. Atteia, P. Azzarello, P. Bakala, G. Baldazzi, S. Balman, M. Barbera, C. van Baren, S. Bhattacharyya, A. Baykal, T. Belloni, F. Bernardini, G. Bertuccio, S. Bianchi, A. Bianchini, P. Binko, P. Blay, F. Bocchino, P. Bodin, I. Bombaci, J.-M. Bonnet Bidaud, S. Boutloukos, L. Bradley, J. Braga, E. Brown, N. Bucciantini, L. Burderi, M. Burgay, M. Bursa, C. Budtz-Jørgensen, E. Cackett, F. Cadoux, P. Caïs, G. Caliandro, R. Campana, S. Campana, F. Capitanio, J. Casares, P. Casella, A. Castro-Tirado, E. Cavazzuti, P. Cerda-Duran, D. Chakrabarty, F. Château, J. Chenevez, J. Coker, R. Cole, A. Collura, R. Cornelisse, T. Courvoisier, A. Cros, A. Cumming, G. Cusumano, A. D'Ai, V. D'Elia, E. Del Monte, A. de Luca, D. de Martino, J. P. C. Dercksen, M. de Pasquale, A. De Rosa, M. Del Santo, S. Di Cosimo, S. Diebold, T. Di Salvo, I. Donnarumma, A. Drago, M. Durant, D. Emmanoulopoulos, M. H. Erkut, P. Esposito, Y. Evangelista, A. Fabian, M. Falanga, Y. Favre, C. Feldman, V. Ferrari, C. Ferrigno, M. Finger, G. Fraser, M. Frericks, F. Fuschino, M. Gabler, D. K. Galloway, J. L. Galvez Sanchez, E. Garcia-Berro, B. Gendre, S. Gezari, A. B. Giles, M. Gilfanov, P. Giommi, G. Giovannini, M. Giroletti, E. Gogus, A. Goldwurm, K. Goluchová, D. Götz, C. Gouiffes, M. Grassi, P. Groot, M. Gschwender, L. Gualtieri, C. Guidorzi, L. Guy, D. Haas, P. Haensel, M. Hailey, F. Hansen, D. Hartmann, C. A. Haswell, K. Hebeler, A. Heger, W. Hermsen, J. Homan, A. Hornstrup, R. Hudec, J. Huovelin, A. Ingram, J. In't Zand, G. Israel, K. Iwasawa, L. Izzo, H. Jacobs, F. Jetter, T. Johannsen, P. Jonker, J. Josè, P. Kaaret, G. Kanbach, V. Karas, D. Karelin, D. Kataria, L. Keek, T. Kennedy, D. Klochkov, W. Kluzniak, K. Kokkotas, S. Korpela, C. Kouveliotou, I. Kreykenbohm, L. Kuiper, I. Kuvvetli, C. Labanti, D. Lai, F. Lamb, P. Laubert, F. Lebrun, D. Lin, D. Linder, G. Lodato, F. Longo, N. Lund, T. J. Maccarone, D. Macera, S. Maestre, S. Mahmoodifar, D. Maier, P. Malcovati, I. Mandel, V. Mangano, A. Manousakis, M. Marisaldi, A. Markowitz, A. Martindale, G. Matt, I. McHardy, A. Melatos, M. Mendez, S. Mereghetti, M. Michalska, S. Migliari, R. Mignani, M. C. Miller, J. M. Miller, T. Mineo, G. Miniutti, S. Morsink, C. Motch, S. Motta, M. Mouchet, G. Mouret, J. Mulačová, F. Muleri, T. Muñoz-Darias, I. Negueruela, J. Neilsen, A. Norton, M. Nowak, P. O'Brien, P. E. H. Olsen, M. Orienti, M. Orio, M. Orlandini, P. Orleański, J. Osborne, R. Osten, F. Ozel, L. Pacciani, M. Paolillo, A. Papitto, J. Paredes, A. Patruno, B. Paul, E. Perinati, A. Pellizzoni, A. V. Penacchioni, M. A. Perez, V. Petracek, C. Pittori, J. Pons, J. Portell, A. Possenti, J. Poutanen, M. Prakash, P. Le Provost, D. Psaltis, D. Rambaud, P. Ramon, G. Ramsay, M. Rapisarda, A. Rachevski, I. Rashevskaya, P. Ray, N. Rea, S. Reddy, P. Reig, M. Reina Aranda, R. Remillard, C. Reynolds, L. Rezzolla, M. Ribo, R. de la Rie, A. Riggio, A. Rios, P. Rodríguez-Gil, J. Rodriguez, R. Rohlfs, P. Romano, E. M. R. Rossi, A. Rozanska, A. Rousseau, F. Ryde, L. Sabau-Graziati, G. Sala, R. Salvaterra, A. Sanna, J. Sandberg, S. Scaringi, S. Schanne, J. Schee, C. Schmid, S. Shore, R. Schneider, A. Schwenk, A. Schwope, J.-Y. Seyler, A. Shearer, A. Smith, D. Smith, P. Smith, V. Sochora, P. Soffitta, P. Soleri, A. Spencer, B. Stappers, A. Steiner, N. Stergioulas, G. Stratta, T. Strohmayer, Z. Stuchlik, S. Suchy, V. Sulemainov, T. Takahashi, F. Tamburini, T. Tauris, C. Tenzer, L. Tolos, F. Tombesi, J. Tomsick, G. Torok, J. M. Torrejon, D. F. Torres, A. Tramacere, A. Trois, R. Turolla, S. Turriziani, P. Uter, P. Uttley, A. Vacchi, P. Varniere, S. Vaughan, S. Vercellone, V. Vrba, D. Walton, S. Watanabe, R. Wawrzaszek, N. Webb, N. Weinberg, H. Wende, P. Wheatley, R. Wijers, R. Wijnands, M. Wille, C. Wilson-Hodge, B. Winter, K. Wood, G. Zampa, N. Zampa, L. Zampieri, L. Zdunik, A. Zdziarski, B. Zhang, F. Zwart, M. Ayre, T. Boenke, C. Corral van Damme, Erik Kuulkers, D. Lumb
Proceedings Volume 9144, 91442T (2014) https://doi.org/10.1117/12.2055913
KEYWORDS: Sensors, X-rays, Collimators, Physics, Spectral resolution, Stars, Observatories, Astronomy, Space operations, Gamma radiation

Proceedings Article | 24 July 2014 Paper
Proceedings Volume 9144, 91442G (2014) https://doi.org/10.1117/12.2057347
KEYWORDS: Mirrors, Silicon, X-rays, Spatial resolution, Optics manufacturing, X-ray optics, Semiconducting wafers, Point spread functions, Wafer-level optics, Optical design

Proceedings Article | 24 July 2014 Paper
Proceedings Volume 9144, 91442H (2014) https://doi.org/10.1117/12.2055950
KEYWORDS: Mirrors, Silicon, Interfaces, X-rays, Space telescopes, Space mirrors, X-ray optics, Telescopes, Computer aided design, X-ray technology

Proceedings Article | 24 July 2014 Paper
Proceedings Volume 9144, 91442F (2014) https://doi.org/10.1117/12.2055920
KEYWORDS: Mirrors, Silicon, X-rays, X-ray optics, Observatories, X-ray technology, Spatial resolution, X-ray telescopes, High energy astrophysics, Space operations

Proceedings Article | 26 September 2013 Paper
Proceedings Volume 8861, 88611E (2013) https://doi.org/10.1117/12.2024064
KEYWORDS: Mirrors, Stray light, Silicon, Manufacturing, X-ray optics, Prototyping, Space telescopes, Etching, X-rays, Optical alignment

Proceedings Article | 26 September 2013 Paper
Proceedings Volume 8861, 88610M (2013) https://doi.org/10.1117/12.2024982
KEYWORDS: Silicon, Mirrors, Spatial resolution, X-ray optics, Optics manufacturing, X-rays, Wafer-level optics, Semiconducting wafers, Reflection, X-ray telescopes

Proceedings Article | 26 September 2013 Paper
Marcos Bavdaz, Eric Wille, Kotska Wallace, Brian Shortt, Sebastiaan Fransen, Nicola Rando, Maximilien Collon, Marcelo Ackermann, Giuseppe Vacanti, Ramses Günther, Jeroen Haneveld, Mark Olde Riekerink, Arenda Koelewijn, Coen van Baren, Dirk Kampf, Karl-Heintz Zuknik, Arnd Reutlinger, Finn Christensen, Desiree Della Monica Ferreira, Anders Jakobsen, Michael Krumrey, Peter Müller, Vadim Burwitz, Giovanni Pareschi, Mauro Ghigo, Marta Civitani, Laura Proserpio, Daniele Spiga, Stefano Basso, Bianca Salmaso, Daniele Gallieni, Matteo Tintori, Pierluigi Fumi, Francesco Martelli, Giancarlo Parodi, Ivan Ferrario, Ian Povey
Proceedings Volume 8861, 88610L (2013) https://doi.org/10.1117/12.2024989
KEYWORDS: Mirrors, X-ray optics, Glasses, X-rays, Optical coatings, Multilayers, Silicon, Sensors, X-ray technology, Spatial resolution

Proceedings Article | 17 September 2012 Paper
Proceedings Volume 8443, 844329 (2012) https://doi.org/10.1117/12.926111
KEYWORDS: Mirrors, X-rays, Silicon, X-ray optics, Observatories, X-ray technology, Spatial resolution, Telescopes, Semiconducting wafers, High energy astrophysics

Proceedings Article | 7 October 2011 Paper
Maximilien Collon, Ramses Günther, Marcelo Ackermann, Rakesh Partapsing, Giuseppe Vacanti, Marco Beijersbergen, Marcos Bavdaz, Kotska Wallace, Erik Wille, Mark Olde Riekerink, Jeroen Haneveld, Arenda Koelewijn, Coen van Baren, Peter Müller, Michael Krumrey, Michael Freyberg, Anders Jakobsen, Finn Christensen
Proceedings Volume 8147, 81470D (2011) https://doi.org/10.1117/12.893418
KEYWORDS: Silicon, X-rays, Mirrors, Robots, X-ray optics, Spatial resolution, Semiconducting wafers, Optics manufacturing, Metrology, Space telescopes

Proceedings Article | 7 October 2011 Paper
Proceedings Volume 8147, 81470C (2011) https://doi.org/10.1117/12.893567
KEYWORDS: Mirrors, Space telescopes, Telescopes, X-rays, X-ray optics, Silicon, Observatories, Spatial resolution, Space operations, Manufacturing

Proceedings Article | 7 October 2011 Paper
Giuseppe Vacanti, Marcelo Ackermann, Coen van Baren, Marco Beijersbergen, Maximilien Collon, Michael Freyberg, Ramses Günther, Jeroen Haneveld, Arenda Koelewijn, Erik Maddox, Mark Olde Riekerink, Rakesh Partapsing
Proceedings Volume 8147, 81470F (2011) https://doi.org/10.1117/12.893598
KEYWORDS: Sensors, Stray light, X-ray optics, X-rays, Photons, Mirrors, Silicon, 3D modeling, Astronomical imaging, Reflection

Proceedings Article | 4 May 2011 Paper
Proceedings Volume 8076, 80760A (2011) https://doi.org/10.1117/12.889269
KEYWORDS: Mirrors, Nickel, Spatial resolution, Coating, Gold, X-rays, Geometrical optics, Metals, X-ray optics, Silicon

Proceedings Article | 30 July 2010 Paper
Proceedings Volume 7732, 77322T (2010) https://doi.org/10.1117/12.858121
KEYWORDS: Mirrors, Silicon, Optical benches, Optical mounts, Optics manufacturing, Interfaces, Tolerancing, Thermography, X-ray optics, Space telescopes

Proceedings Article | 29 July 2010 Paper
Proceedings Volume 7732, 77321F (2010) https://doi.org/10.1117/12.858166
KEYWORDS: Mirrors, Silicon, X-rays, X-ray optics, Optics manufacturing, Surface roughness, Particles, X-ray telescopes, Polishing, Semiconducting wafers

Proceedings Article | 15 July 2008 Paper
J. W. den Herder, R. Kelley, D. McCammon, K. Mitsuda, H. Aarts, C. van Baren, M. Buntov, E. Churazov, E. Costantini, J. Cottam, L. Dubbeldam, Y. Ezoe, P. Friedrichs, R. Fujimoto, M. Gilvanov, Y. Ishisaki, J. Kaastra, C. Kilbourne, K. Kuntz, R. Mushotzky, M. Murakami, T. Nakagawa, T. Ohashi, M. Pavlinsky, R. Petre, F. Scott Porter, P. Predehl, Y. Sato, N. Semena, K. Shinozaki, R. Smith, S. Snowden, R. Sunyaev, H. Sugita, Y. Takei, A. Tkachenko, J. Vink, C. de Vries, N. White, N. Yamasaki, F. Zwart
Proceedings Volume 7011, 70110K (2008) https://doi.org/10.1117/12.786474
KEYWORDS: X-rays, Sensors, Mirrors, Signal to noise ratio, Spectral resolution, Plasmas, Galaxy groups and clusters, Temperature metrology, Ionization, Iron

Proceedings Article | 13 June 2006 Paper
Proceedings Volume 6266, 626618 (2006) https://doi.org/10.1117/12.673269
KEYWORDS: X-ray optics, X-rays, Silicon, Integrated optics, Mirrors, Metrology, Space telescopes, Optical alignment, Interfaces, Telescopes

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