As an excellent method for extracting distinctive invariant features from images, SIFT (scale-invariant feature transform) can effectively resist affine transformation such as translation and rotation of images, and theoretically has better resistance to illumination changes [1]. However, in practical applications the performance of SIFT is always affected by the contrast reduction caused by illumination changes. In this paper, the performance of SIFT under different contrasts is systematically analyzed and evaluated, and a reasonable explanation is given for the reason of SIFT performance change under different illumination conditions. And a SIFT fast matching method based on contrast compression is proposed.
In this paper, an image classification algorithm for airport area is proposed, which based on the statistical features of synthetic aperture radar (SAR) images and the spatial information of pixels. The algorithm combines Gamma mixture model and MRF. The algorithm using Gamma mixture model to obtain the initial classification result. Pixel space correlation based on the classification results are optimized by the MRF technique. Additionally, morphology methods are employed to extract airport (ROI) region where the suspected aircraft target samples are clarified to reduce the false alarm and increase the detection performance. Finally, this paper presents the plane target detection, which have been verified by simulation test.
Aiming at vehicle detection on the ground through low resolution SAR images, a method is proposed for determining the region of the vehicles first and then detecting the target in the specific region. The experimental results show that this method not only reduces the target detection area, but also reduces the influence of terrain clutter on the detection, which greatly improves the reliability of the target detection.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.