Dr. D. C. Hurley
Physicist at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 7 June 2002 Paper
Donna Hurley, Joshua Wiehn, Joseph Turner, Paul Rice
Proceedings Volume 4703, (2002) https://doi.org/10.1117/12.469632
KEYWORDS: Finite element methods, Niobium, Aluminum, Acoustics, Atomic force microscopy, Silicon, Testing and analysis, Scanning electron microscopy, Glasses, Calibration

Proceedings Article | 24 April 2002 Paper
Alan Smith, Richard McDonald, Donna Hurley, Steven Holland, Donald Groom, William Brown, David Gilmore, Richard Stover, Mingzhi Wei
Proceedings Volume 4669, (2002) https://doi.org/10.1117/12.463423
KEYWORDS: Muons, Charge-coupled devices, Lead, Gamma radiation, Spectroscopy, Electrons, Potassium, Silicon, Neodymium, Glasses

Conference Committee Involvement (4)
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV
1 March 2006 | San Diego, CA, United States
Testing, Reliability, and Application of Micro- and Nano-Material Systems III
9 March 2005 | San Diego, CA, United States
Testing, Reliability, and Application of Micro-and Nano-Material Systems II
15 March 2004 | San Diego, CA, United States
Testing, Reliability, and Application of Micro- and Nano-Material Systems
3 March 2003 | San Diego, California, United States
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