Dr. Dali Liu
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 March 2015 Paper
Proceedings Volume 9446, 94463D (2015) https://doi.org/10.1117/12.2181352
KEYWORDS: Confocal microscopy, Microscopes, Image restoration, Signal detection, Image quality, Optical simulations, Statistical modeling, Computer simulations, Sensors, Laser damage threshold

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