Ms. Dandan Liu Profile

Dandan Liu

at Tianjin Jinhang Institute of Technical Physics

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Author

Publications (14)

SPIE Journal Paper | 25 November 2021

Infrared optical properties of SiO₂ films on silicon substrate under different temperatures

Yugang Jiang, Huasong Liu, Jinlin Bai, Ziyang Li, Xiao Yang, Dan Chen, Jiahuan He, Lishuan Wang, Dandan Liu

OE, Vol. 61, Issue 03, 031204, (November 2021) https://doi.org/10.1117/12.10.1117/1.OE.61.3.031204

KEYWORDS: Refractive index, Silicon films, Silicon, FT-IR spectroscopy, Temperature metrology, Optical properties, Infrared radiation, Dielectrics, Transmittance, Silica

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Proceedings Article | 8 July 2019 Paper

Study on band gap and dispersion model of Al2O3 thin films with different oxygen flow rates by ion beam sputtering

Jiahuan He, Dan Chen, Lishuan Wang, Shida Li, Dandan Liu, Yugang Jiang, Meiping Zhu, Huasong Liu

Proceedings Volume 11064, 1106413 (2019) https://doi.org/10.1117/12.2539622

KEYWORDS: Thin films, Ion beams, Absorption, Sputter deposition, Reflection, Surface roughness

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Proceedings Article | 16 January 2019 Paper

Annealing effects on the structural and optical properties of HfO2 thin films deposited by thermal evaporation technique

Shida Li, Xiaoli Liu , Huasong Liu , Lishuan Wang, Yugang Jiang , Peng Shang, Xiao Yang , Dandan Liu , Yiqin Ji

Proceedings Volume 10838, 108381L (2019) https://doi.org/10.1117/12.2506510

KEYWORDS: Annealing, Hybrid fiber optics, Thin films, Refractive index, Optical properties, Thin film deposition, Heat treatments, Transmittance, Hafnium, Oxides

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Proceedings Article | 12 December 2018 Paper

Study on the design and preparation of wideband deep cutoff bandpass filter

Yugang Jiang, Huasong Liu, Dan Chen, Lishuan Wang, Dandan Liu, Shida Li, Jiahuan He, Chenghui Jiang, Yiqin Ji

Proceedings Volume 10847, 1084708 (2018) https://doi.org/10.1117/12.2504060

KEYWORDS: Transmittance, Bandpass filters, Refractive index, Ion beams, Sputter deposition, Tantalum, Thin films, Optical filters, Manufacturing, Spectrophotometry

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Proceedings Article | 27 June 2018 Paper

Research VIS-NIR optical constants of Si films deposited by different techniques

Dandan Liu, Huasong Liu, Yiqin Ji, Yugang Jiang, Yuzhe Xing, Jian Leng, Kewen Zhuang

Proceedings Volume 10691, 106910P (2018) https://doi.org/10.1117/12.2312052

KEYWORDS: Silicon films, Refractive index, Transmittance, Ion beams, Silicon, Electron beams, Silica, Sputter deposition, Heat treatments, Reflectivity

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Proceedings Article | 6 June 2018 Paper

Design of reflective filter based on metal-dielectric thin films for radiation wavelength of carbon dioxide

Xiao Yang, Xiaoli Liu, Huasong Liu, Peng Sun, Dandan Liu, Yiqin Ji

Proceedings Volume 10691, 106911R (2018) https://doi.org/10.1117/12.2313072

KEYWORDS: Thin films, Optical filters, Reflectivity, Dielectrics, Reflection, Dielectric filters, Metals, Absorption, Infrared imaging, Infrared radiation

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Proceedings Article | 28 October 2016 Paper

Experimental investigation of the ultra-precision turning capability of PVD ZnSe

Wei-hao Li, Kun Yang, Peng Wang, Gao-feng Zhang, Dan-dan Liu

Proceedings Volume 9683, 968319 (2016) https://doi.org/10.1117/12.2243298

KEYWORDS: Crystals, Radium, Infrared radiation, Diamond, Profilometers, Chemical vapor deposition, Spindles, Infrared imaging, Macula, Image quality

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Proceedings Article | 21 August 2014 Paper

Multiple spectrum analysis and evaluation for optical constants of HfO2 thin films

Dandan Liu, Huasong Liu, Chenghui Jiang, Yugang Jiang, Lishuan Wang, Zhihong Zhao, Yiqin Ji

Proceedings Volume 9283, 92830G (2014) https://doi.org/10.1117/12.2070046

KEYWORDS: Transmittance, Thin films, Data modeling, Refractive index, Spectrum analysis, Ellipsometry, Spectroscopic ellipsometry, Thin film deposition, Silica, Ion beams

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Proceedings Article | 6 August 2014 Paper

Experiment study on the cutting property of hot press Zinc Sulfide by single point diamond turning

Weihao Li, Yi Tong, Weiyan Lian, Dandan Liu, Hao Zhang

Proceedings Volume 9281, 928116 (2014) https://doi.org/10.1117/12.2068183

KEYWORDS: Zinc, Surface finishing, Radium, Polishing, Chemical vapor deposition, Single point diamond turning, Crystals, Infrared radiation, Optical spheres, Optics manufacturing

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Proceedings Article | 11 September 2013 Paper

The design and analysis of wide angle and broadband infrared antireflective film

Jian Leng, Yi-qin Ji, Hua-song Liu, Ke-wen Zhuang, Dan-dan Liu

Proceedings Volume 8907, 89072M (2013) https://doi.org/10.1117/12.2033061

KEYWORDS: Zinc, Transmittance, Antireflective coatings, Polarization, Infrared radiation, Refractive index, Physics, Germanium, Autoregressive models, Thin films

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Proceedings Article | 30 August 2013 Paper

Calculate IR optical constants of Si substrate under high temperature condition

Yugang Jiang, Lishuan Wang, Huasong Liu, Dandan Liu, Chenghui Jiang, Deying Chen, Yaping Yang, Yiqin Ji

Proceedings Volume 8910, 89100C (2013) https://doi.org/10.1117/12.2031884

KEYWORDS: Silicon, Temperature metrology, Refractive index, FT-IR spectroscopy, Thin films, Dielectrics, Infrared radiation, Transmittance, Design for manufacturability, Spectroscopy

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Proceedings Article | 16 October 2012 Paper

Aging effect of optical properties on SiO2 films grown on Si substrates by ion beam sputtering

Yiqin Ji, Huasong Liu, Yugang Jiang, Dandan Liu, Lishuan Wang, Chenghui Jiang, Rongwei Fan, Deying Chen

Proceedings Volume 8416, 84161F (2012) https://doi.org/10.1117/12.975934

KEYWORDS: Silica, Refractive index, Silicon, Optical properties, Optics manufacturing, Ion beams, Sputter deposition, Spectroscopic ellipsometry, Data modeling, Optical coatings

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Proceedings Article | 16 October 2012 Paper

Insights into effects of thermal annealing on optical properties of SiO2 films

Yugang Jiang, Yiqin Ji, Huasong Liu, Dandan Liu, Lishuan Wang, Chenghui Jiang, Yaping Yang, Deying Chen

Proceedings Volume 8416, 84160F (2012) https://doi.org/10.1117/12.974980

KEYWORDS: Annealing, Silica, Refractive index, Thermal effects, Optical properties, Thin films, Thermography, Silicon, Ion beams, Sputter deposition

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Proceedings Article | 22 October 2010 Paper

Texture recognition of SAR image based on surfacelet transform

Dandan Liu, Can Zhao, Chunrui Tang

Proceedings Volume 7658, 76583R (2010) https://doi.org/10.1117/12.866701

KEYWORDS: Synthetic aperture radar, Image processing, Neural networks, Detection and tracking algorithms, Statistical modeling, Device simulation, Feature extraction, Image enhancement, Reflection, Image classification

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Showing 5 of 14 publications

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