We present recent results aiming to construct single photon sources, detectors and gates using the integration of hot Rubidium atoms and microring resonators (MRRs). We demonstrate strong coupling between an ensemble of ≈53 atoms interacting with a high-Q (>4x10^5) cavity mode, with a many-atom coupling strength g/2pi≈1 GHz and cooperativity C≈3.6 achieved. A peak single-atom cooperativity C0≈0.4 is inferred; to achieve higher cooperativity, we have developed defect mode photonic crystal ring resonators with a 10x reduction in mode volume compared to the MRR while maintaining Q>10^5. Finally, we will discuss theoretical results that support single photon operations using these devices.
We introduce the traceable calibration of a cryogenic localization microscope, enabling accurate localization of quantum dots to improve subsequent integration into photonic cavities. We combine the calibration results with an assessment of fabrication accuracy by electron-beam lithography to introduce a comprehensive model of the effects of registration errors in the integration process on Purcell factor. Our theory shows the possibility of significantly improving the magnitude and distribution of Purcell factor across a wide field, enabling dramatic increases of process yield.
Atomic vapor cells are an important component of many quantum experiments, and MEMS fabrication techniques allow for miniaturization of vapor cells and their associated experiments. Anodic bonding is the most popular technique for this cell fabrication, but it is limited to simple glass-to-silicon bonding interfaces. Here we present fabrication of a MEMS vapor cell using a stack that includes PIC-compatible thin-film borosilicate glass as a bonding surface. We anodically bond a deposited thin film of borosilicate glass to a patterned silicon frame during our fabrication of a MEMS rubidium vapor cell. This technique will allow for wider integration of MEMS vapor cells to photonic integrated circuits.
Shift happens due to electron beam tilt in scanning electron microscopy. To measure this aberration effect with submilliradian uncertainty, and to calibrate scale factor and correct scanfield distortion, we introduce conical frustum arrays as multifunctional reference structures. Our concept shows promise for new accuracy in scanning electron microscopy.
Wavelength references in the telecom spectrum have applications in communications and dimensional metrology. However, they typically consist of bulk optics and vapor cells. Photonic integration of these components may lead to low cost, portable devices.
Here we demonstrate the incorporation of a photonic Rb spectrometer with an AlN microresonator frequency doubler. Light at 1560 nm is coupled onto a chip containing the AlN microresonator frequency doubler. The resulting 780 nm light is sent to the photonic Rb spectrometer, which consists of an apodized grating beam expander and microfabricated MEMS vapor cell. We perform Doppler broadened spectroscopy of the D2 line and demonstrate preliminary laser stabilization to these features.
In the pursuit of developing a portable wavelength reference, a photonically integrated chip (PIC) was developed to perform high resolution spectroscopy in a small package. The PIC outcouples light from one grating into free space where it is reflected and directed into an adjacent grating that couples into a separate waveguide. These gratings are extreme-mode-converters which convert the confined mode with a characteristic mode size of less than a micron to a collimated 100 micron diameter beam in order to mitigate transit time broadening for high resolution spectroscopy as well as reduce the diffraction angle. A miniature atomic vapor cell is inserted in the path of the beam to complete the spectroscopic platform. Preliminary results demonstrate sub-Doppler features. Coupling into the chip is achieved using fiber arrays enabling the spectroscopic signal to be routed back through an optical fiber and monitored. A laser is then locked to these sub-Doppler features completing an integrated wavelength reference. Analysis of the atom-light interactions made available by this platform will be discussed with an emphasis on the application of such structures to portable wavelength metrology.
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