Dr. David Benavente Profile

Dr. David Benavente

at Univ de Alicante

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Proceedings Article | 1 April 2020 Paper

Use of image correlation to measure hygric swelling in rocks

Belén Ferrer, M. Baralida Tomás, David Benavente, David Mas

Proceedings Volume 11353, 113531T (2020) https://doi.org/10.1117/12.2555077

KEYWORDS: Digital image correlation, Cameras, Image processing, Sensors, Imaging systems, Speckle, Image resolution, Objectives

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Some materials undergo an hygric expansion when they are soaked. In porous rocks, this effect is enhanced by the pore space that allows the water to reach every part of its volume and to hydrate the most of their swelling parts. This enlargement has negative structural consequences in the vicinity since adjacent elements will support some compressions or displacements. Recently image-based methods have arisen in this field due to their advantages versus traditional methods. Among all image processing methods, digital image correlation (DIC) is one of the most used in all areas. In this work, we propose a new methodology based on DIC for the calculation of the hygric expansion of materials. We use porous sandstone, with dimensions 14x14x30 mm to measure its hygric swelling using an industrial digital camera and a telecentric objective. We took one image every 5 minutes to characterize the whole swelling process. Due the large magnification, the whole 14 mm length of one contour was not in the image and therefore we lost the image scale reference. To solve this, a 1951 USAF test was used to calibrate the imagen. The telecentric objective and a narrow deep of field allowed to have the specimen surface exactly on the same plane that the USAF test was during the calibration. The image was pointed to one corner of the specimen, to obtain information not only of its vertical displacement due to its expansion but also of its horizontal movement. Preliminary results show that the proposed methodology provides reliable information of the hygric swelling using a non-contact methodology, with an accuracy of 1 micron.

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