Dr. David J. Benson Profile

Dr. David J. Benson

Research Physicist at US Army CCDC C5ISR Ctr Night Vision & Electronic Sensors Directorate

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Publications (7)

Proceedings Article | 5 September 2018 Paper

Tip-enhanced stimulated Raman scattering with ultra-high-aspect-ratio tips and confocal polarization Raman spectroscopy for evaluation of sidewalls in Type II superlattices FPAs

Fei-Hung Chu, G. Smolyakov, C. F. Wang, Y. Gao, C. Wang, K. Malloy, A. Ukhanov, D. Pete, M. Jaime-Vasquez, N. Baril, J. Benson, D. Tenne

Proceedings Volume 10726, 107261C (2018) https://doi.org/10.1117/12.2504541

KEYWORDS: Raman spectroscopy, Atomic force microscopy, Gallium antimonide, Near field optics, Phonons, Raman scattering, Gold, Semiconductor lasers, Polarization

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Proceedings Article | 16 September 2011 Paper

MBE growth of ZnTe and HgCdSe on Si: a new IR material

Yuanping Chen, Gregory Brill, David Benson, Priyalal Wijewarnasuriya, Nibir Dhar

Proceedings Volume 8155, 815511 (2011) https://doi.org/10.1117/12.894642

KEYWORDS: Silicon, X-rays, Crystals, Tellurium, Infrared materials, Gallium antimonide, Zinc, Semiconducting wafers, Etching, Compound semiconductors

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Proceedings Article | 10 October 2003 Paper

Advanced HgCdTe focal plane arrays

Muren Chu, Hrayr Gurgenian, Shoghig Mesropian, Sevag Terterian, C.C. Wang, J. Benson, Jack Dinan, Latika Becker

Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.485908

KEYWORDS: Mercury cadmium telluride, Diodes, Heterojunctions, Boron, Epitaxy, Cameras, Staring arrays, Long wavelength infrared, Near infrared, Photons

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Proceedings Article | 5 December 2002 Paper

Influence of photoresist feature geometry on ECR plasma-etched HgCdTe trenches

J. David Benson, Andrew Stoltz, Andrew Kaleczyc, Mike Martinka, Leo Almeida, Phillip Boyd, John Dinan

Proceedings Volume 4795, (2002) https://doi.org/10.1117/12.451921

KEYWORDS: Etching, Mercury cadmium telluride, Photoresist materials, Anisotropy, Plasma etching, Photomasks, Lithography, Plasma, Sensors, Chemistry

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Proceedings Article | 24 July 2002 Paper

Fullerene incorporation in DNQ Novolak photoresist for increasing plasma etch resistance

J. David Benson, Andrew Stoltz, Andrew Kaleczy, John Dinan

Proceedings Volume 4690, (2002) https://doi.org/10.1117/12.474200

KEYWORDS: Plasma etching, Etching, Fullerenes, Plasma, Resistance, Photoresist materials, Mercury cadmium telluride, Dry etching, Standards development, Polymers

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Proceedings Article | 27 June 1996 Paper

MBE flexible manufacturing for HgCdTe focal plane arrays

J. Benson, John Dinan, James Waterman, Christopher Summers, Rudolph Benz, Brent Wagner, S. Pearson, Ashesh Parikh, John Jensen, Owen Wu, Rajesh Rajavel, G. Kamath, Karl Harris, Steven Jost, Jose Arias, Lester Kozlowski, Majid Zandian, Jagmohan Bajaj, Kadri Vural, Roger DeWames, Charles Cockrum, G. Venzor, Scott Johnson, H.-D. Shih, M. Bevan, J. Dodge, Art Simmons

Proceedings Volume 2744, (1996) https://doi.org/10.1117/12.243457

KEYWORDS: Staring arrays, Manufacturing, Liquid phase epitaxy, Mercury cadmium telluride, Semiconducting wafers, Sensors, Detector arrays, Heterojunctions, Infrared radiation, Detector development

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Proceedings Article | 13 July 1994 Paper

Self-aligned molecular beam epitaxy of CdZnTe for IR focal plane arrays

Nibir Dhar, Phillip Boyd, Paul Amirtharaj, John Dinan, J. Benson

Proceedings Volume 2228, (1994) https://doi.org/10.1117/12.179682

KEYWORDS: Molecular beam epitaxy, Gallium arsenide, Staring arrays, Zinc, Tellurium, Crystals, Laser crystals, Cadmium, Gallium, Optical properties

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Showing 5 of 7 publications

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