Dr. David I. Farrant Profile

Dr. David I. Farrant

Leader - Optical Systems at CSIRO

SPIE Involvement:

Author

Proceedings Article | 18 January 2006 Paper

Fabrication of ultra-high precision optics by selective deposition through a multiple aperture mask

John Arkwright, David Farrant, Jeff Seckold, Wayne Stuart, Edita Puhanic

Proceedings Volume 6038, 603817 (2006) https://doi.org/10.1117/12.638507

KEYWORDS: Photomasks, Lithium niobate, Polishing, Fabrication, Precision optics, Surface finishing, Computer aided design, Sputter deposition, Optical lithography, Dielectrics

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Proceedings Article | 20 August 2005 Paper

Dielectric coatings for customised tunable lithium niobate filters

Svetlana Dligatch, Roger Netterfield, David Farrant

Proceedings Volume 5870, 58700L (2005) https://doi.org/10.1117/12.612876

KEYWORDS: Fabry–Perot interferometers, Transmittance, Reflectivity, Lithium niobate, Optical coatings, Semiconducting wafers, Optical filters, Dielectric filters, Crystals, Tunable filters

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Proceedings Article | 11 November 1999 Paper

Manufacture of LIGO core optics at CSIRO

Christopher Walsh, Achim Leistner, Bozenko Oreb, Jeffrey Seckold, David Farrant, Ronald Bulla, Glenn Davis, Phillip Lennox, Frank Lesha, Edita Pavlovic, Wayne Stuart, Carl Sona, Ruimin Yin

Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369187

KEYWORDS: Polishing, Surface finishing, LIGO, Wavefronts, Tolerancing, Optics manufacturing, Silicon, Beam splitters, Monochromatic aberrations, Interferometers

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Proceedings Article | 11 November 1999 Paper

LIGO optics manufacture: figuring transmission core optics for best performance

Achim Leistner, David Farrant, Bozenko Oreb, Edita Pavlovic, Jeffrey Seckold, Christopher Walsh

Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369188

KEYWORDS: Polishing, Surface finishing, Wavefronts, Optics manufacturing, LIGO, Refractive index, Silicon, Interferometers, Zerodur, Beam splitters

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Proceedings Article | 17 August 1999 Paper

Metrology of transmission optics for LIGO

Christopher Walsh, Achim Leistner, Bozenko Oreb, Jeffrey Seckold, David Farrant, Edita Pavlovic

Proceedings Volume 3745, (1999) https://doi.org/10.1117/12.357795

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Proceedings Article | 13 August 1999 Paper

Combined deformation and shape measurement with ESPI

David Farrant, Jon Petzing, John Tyrer, Bozenko Oreb

Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357749

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Proceedings Article | 13 August 1999 Paper

Metrology of LIGO core optics

Bozenko Oreb, David Farrant, Christopher Walsh, Achim Leistner, Frank Lesha, Philip Fairman, Carl Sona

Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357716

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SPIE Journal Paper | 1 August 1999

300-mm-aperture phase-shifting Fizeau interferometer

Philip Fairman, B. Ward, Bozenko Oreb, David Farrant, Yves Gilliand, Christopher Freund, Achim Leistner, Jeffrey Seckold, Christopher Walsh

OE, Vol. 38, Issue 08, (August 1999) https://doi.org/10.1117/12.10.1117/1.602180

KEYWORDS: Phase shifts, Nanoimprint lithography, Optical testing, Monochromatic aberrations, Wavefronts, Fizeau interferometers, Semiconductor lasers, Sensors, Beam splitters, Foam

Proceedings Article | 12 December 1997 Paper

Transient deformation measurement using dual-pulse addition ESPI

David Farrant, Guillermo Kaufmann, Jon Petzing, John Tyrer, Bozenko Oreb, David Kerr

Proceedings Volume 3173, (1997) https://doi.org/10.1117/12.294507

KEYWORDS: Bandpass filters, Speckle pattern, Interferometry, Imaging systems, Nd:YAG lasers, Cameras, Laser development, Quantitative analysis, Mirrors, Fourier transforms

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Proceedings Article | 1 November 1997 Paper

Metrology of LIGO Pathfinder optics

David Farrant, Achim Leistner, Bozenko Oreb, Mark Suchting, Christopher Walsh

Proceedings Volume 3134, (1997) https://doi.org/10.1117/12.279140

KEYWORDS: Monochromatic aberrations, Interferometers, Spatial frequencies, LIGO, Metrology, Optical testing, Manufacturing, Phase measurement, Calibration, Surface finishing

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Proceedings Article | 14 June 1995 Paper

Simultaneous measurements of vector components of displacement by ESPI and FFT techniques

Toshiyuki Takatsuji, Bozenko Oreb, David Farrant, Philip Fairman

Proceedings Volume 2544, (1995) https://doi.org/10.1117/12.211870

KEYWORDS: Speckle, Fourier transforms, Modulation, Speckle pattern, Interferometry, Light scattering, Image processing, Electronic components, Image filtering, Cameras

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Proceedings Article | 1 July 1990 Paper

Quantitative modal analysis of ultrasonic transducers by stroboscopic holographic interferometry

Bozenko Oreb, David Farrant

Proceedings Volume 1319, (1990) https://doi.org/10.1117/12.22301

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Showing 5 of 12 publications

Conference Committee Involvement (1)

Interferometry XVII: Techniques and Analysis

17 August 2014 | San Diego, California, United States

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