David B. Primhak
at Land Instruments International Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 May 2010 Paper
Proceedings Volume 7661, 76610L (2010) https://doi.org/10.1117/12.850866
KEYWORDS: Temperature metrology, Thermography, Profiling, Cameras, Gases, Infrared radiation, Visualization, Reflection, Process control, Measurement devices

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