Spectrum analysis technique is introduced to measure the time delay of the
silicon-on-insulator (SOI) micro-ring slow light device. The interference spectra of the TE and the
TM polarization are obtained based on dual-quadrature spectral interferometry technique. By
analyzing the observed spectral interference, the phase and time delay of the output optical pulse
of SOI micro-ring is estimated. This method has a very high accuracy of time measurement
because it avoids the impact of response speed of optoelectronic device, and moreover, it provides
a complete measurement of the complex electric field as a continuous function of frequency.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.