CONFERENCE PROCEEDINGS
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Prof. Dong-Seon Lee
Professor at Gwangju Institute of Science and Technology
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 9 March 2020 Presentation
Full-color LED integration based on adhesive bonding for micro-LED display applications (Conference Presentation)
Proceedings Volume 11302, 1130205 (2020) https://doi.org/10.1117/12.2537958
KEYWORDS: Adhesives, LED displays, Light emitting diodes, Thin films, Blue light emitting diodes, RGB color model, Lithography, Metalorganic chemical vapor deposition, Thin film deposition
Proceedings Article | 28 April 2017 Presentation
Electrical modulation and switching of acoustic phonons (Conference Presentation)
Young-Dahl Jho, Hoonil Jeong, Christopher Stanton, Dong-Sean Lee, Minyeo Kim
Proceedings Volume 10112, 101121V (2017) https://doi.org/10.1117/12.2251320
KEYWORDS: Photonics, Wave propagation, Geometrical optics, Phonons, Acoustics, Modulation, Switching, Heterojunctions, Interfaces, Ultrafast phenomena
Proceedings Article | 10 February 2011 Paper
Integrating optical system designed for multimodal analysis of pearls and its mother oyster to distinguish and appraise cultured pearls
Myeong Jin Ju, Sang Jin Lee, Yuri Kim, Jun Geun Shin, Do Hyung Kim, Hae Yeon Kim, Dong Seon Lee, Byeong Ha Lee
Proceedings Volume 7892, 78920T (2011) https://doi.org/10.1117/12.873545
KEYWORDS: Optical coherence tomography, Luminescence, Wavelength division multiplexing, System integration, Optical design, Image segmentation, Fluorescence spectroscopy, Integrated optics, Dispersion, Ocean optics
SPIE Journal Paper | 1 April 2002
In-situ ER-doped GaN optical storage devices using high-resolution focused ion beam milling
OE, Vol. 41, Issue 04, (April 2002) https://doi.org/10.1117/12.10.1117/1.1461833
KEYWORDS: Upconversion, Gallium nitride, Erbium, Optical storage, Ion beams, Infrared lasers, Gallium, Logic, Photons, Data storage
Proceedings Article | 7 July 1997 Paper
Pattern deformation induced from intensity-unbalanced off-axis illumination
Proceedings Volume 3051, (1997) https://doi.org/10.1117/12.275980
KEYWORDS: Image quality, Diffraction, Semiconducting wafers
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