Dr. Dongliang Zhang
at China Electronics Technology Group Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 18 November 2019 Paper
Proceedings Volume 11196, 111961R (2019) https://doi.org/10.1117/12.2538805
KEYWORDS: Silicon, Transmittance, Fabry–Perot interferometers, Antireflective coatings, Reflectivity, Refractive index, Autoregressive models, Mirrors, Reflectors, Titanium dioxide

Proceedings Article | 12 December 2018 Paper
Dongliang Zhang, Xiaoyan Hu, Dachuan Liu, Xiao Lin, Weiping Wang, Ziyu Ding, Zhiqiang Wang, Buwen Cheng, Chunlai Xue
Proceedings Volume 10846, 108461B (2018) https://doi.org/10.1117/12.2504669
KEYWORDS: Avalanche photodetectors, Silicon, Germanium, Tin, Short wave infrared radiation, Avalanche photodiodes, Photodetectors

Proceedings Article | 20 February 2018 Paper
Xiaoyan Hu, Xi Wang, Ziyu Ding, Xiao Lin, Dongliang Zhang, Weiping Wang
Proceedings Volume 10697, 106974I (2018) https://doi.org/10.1117/12.2307810
KEYWORDS: Polarization, Sensors, Image processing, Indium gallium arsenide, Polarizers, Infrared detectors, Image restoration, Imaging systems, Staring arrays, Charge-coupled devices

Proceedings Article | 20 February 2018 Paper
Xiao Lin, Ziyu Ding, Xiaoyan Hu, Weiping Wang, Dongliang Zhang, Dachuan Liu, Kenan Zhang
Proceedings Volume 10697, 106974H (2018) https://doi.org/10.1117/12.2307805
KEYWORDS: Mercury cadmium telluride, Infrared detectors, Quantum efficiency, Photonic crystals, Signal to noise ratio, Sensors, Finite element methods, Antireflective coatings, Finite-difference time-domain method, Optical simulations

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