Dr. Donyau Chiang Profile

Dr. Donyau Chiang

CTO at Taiwan Instrument Research Institute

SPIE Involvement:

Author

Publications (4)

SPIE Journal Paper | 22 July 2014

Dual-photoresist complementary lithography technique for the formation of submicron patterns on sapphire substrates

Chun-Ming Chang, Shih-Feng Tseng, Chao-Te Lee, Wen-Tse Hsiao, J. Andrew Yeh, Donyau Chiang

JM3, Vol. 13, Issue 03, 033004, (July 2014) https://doi.org/10.1117/12.10.1117/1.JMM.13.3.033004

KEYWORDS: Photoresist materials, Oxides, Sapphire, Lithography, Plasma, Etching, Crystals, Laser development, Oxygen, Chlorine

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Proceedings Article | 31 March 2014 Paper

Dual photoresist complimentary lithography technique produces sub-micro patterns on sapphire substrates

Chun-Ming Chang, Shih-Feng Tseng, Chao-Te Lee, Wen-Tse Hsiao, Jer-Liang Yeh, Donyau Chiang

Proceedings Volume 9052, 90521R (2014) https://doi.org/10.1117/12.2044900

KEYWORDS: Photoresist materials, Oxides, Sapphire, Etching, Plasma, Oxygen, Crystals, Lithography, Laser development, Chlorine

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Proceedings Article | 8 September 2010 Paper

The development of an automatic scanning path generation method for the spinneret test

Chun-Jen Chen, Min-Wei Hung, Wenyuh Jywe, Donyau Chiang

Proceedings Volume 7798, 779820 (2010) https://doi.org/10.1117/12.859237

KEYWORDS: Inspection, Capillaries, Light sources, CCD cameras, Light emitting diodes, Image segmentation, Imaging systems, Optical inspection, Microscopes, Applied research

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Proceedings Article | 31 July 2009 Paper

The optical constants of thin films calculated from reflectance and transmittance measurements

Donyau Chiang, Cheng Hung Chu, Hai-Pang Chiang, Ding Ping Tsai

Proceedings Volume 7505, 750518 (2009) https://doi.org/10.1117/12.839471

KEYWORDS: Silver, Reflectivity, Transmittance, Solids, Crystals, Diamond, Numerical analysis, Thin films, Absorption, Refractive index

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Conference Committee Involvement (2)

International Instrumentation and Measurement Technology Conference

23 May 2016 |

Asia Pacific Data Storage Conference

20 November 2013 |

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