Dr. Doug Collins
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 29 January 2008 Paper
Doug Collins, Neinyi Li, Daniel Kuchta, Fuad Doany, Clint Schow, Christopher Helms, Lei Yang
Proceedings Volume 6908, 690809 (2008) https://doi.org/10.1117/12.779135
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Packaging, Transceivers, Photodiodes, Eye, Temperature metrology, Polymer multimode waveguides, Polymers

Proceedings Article | 6 February 2007 Paper
Nein-Yi Li, Doug Collins, Shashank Jatar, Olga Lavrova, Chris Helms, Wenlin Luo, Linlin Liu, Chiyu Liu, Mei Qiu, Kent Roff, Charlie Wang, Chia-Chun Yang, Hwann-Kaeo Chiou
Proceedings Volume 6484, 648402 (2007) https://doi.org/10.1117/12.715079
KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Oxides, Semiconducting wafers, Design for manufacturability, Eye, Standards development, Modulation, Safety, Capacitance

Proceedings Article | 14 March 2005 Paper
Ian Aeby, Lei Yang, Olga Lavrova, Hai Ling, Doug Collins, Charlie Wang, Chiyu Liu, Thomas Whittington
Proceedings Volume 5737, (2005) https://doi.org/10.1117/12.601936
KEYWORDS: Vertical cavity surface emitting lasers, Data communications, Temperature metrology, Fiber optics, Near field optics, Fiber optic communications, Transceivers, Eye, Optical fibers, Reliability

Proceedings Article | 17 June 2003 Paper
Ian Aeby, Doug Collins, Brian Gibson, Christopher Helms, Hong Hou, Wenlin Lou, David Bossert, Charlie Wang
Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482633
KEYWORDS: Vertical cavity surface emitting lasers, Failure analysis, Semiconducting wafers, Reliability, Oxides, Data communications, Optical inspection, Bismuth, Data modeling, Accelerated life testing

Proceedings Article | 4 June 2002 Paper
David Bossert, Doug Collins, Ian Aeby, J. Bridget Clevenger, Christopher Helms, Wenlin Luo, Charlie Wang, Hong Hou
Proceedings Volume 4649, (2002) https://doi.org/10.1117/12.469228
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Picosecond phenomena, Resistance, Modulation, Data communications, Capacitance, Eye, Reliability, Temperature metrology

Showing 5 of 7 publications
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