Dr. Duy N. Nguyen Profile

Dr. Duy N. Nguyen

at Univ of New Mexico

SPIE Involvement:

Author

Publications (16)

SPIE Journal Paper | 9 July 2012

Third harmonic microscopy of intrinsic and induced material anisotropy in dielectric thin films

Reed Weber, Cristina Rodriguez, Duy Nguyen, Luke Emmert, Wolfgang Rudolph, Dinesh Patel, Carmen Menoni

OE, Vol. 51, Issue 12, 121807, (July 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.12.121807

KEYWORDS: Anisotropy, Microscopy, Thin films, Nanoparticles, Silica, Gold, Polarization, Signal to noise ratio, Dielectrics, Polarized microscopy

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Proceedings Article | 12 January 2012 Paper

Subpicosecond laser breakdown in optical thin films

W. Rudolph, L. Emmert, D. Nguyen, C. Karras, Z. Sun, R. Weber

Proceedings Volume 8206, 82060D (2012) https://doi.org/10.1117/12.911285

KEYWORDS: Dielectrics, Electrons, Laser damage threshold, Pulsed laser operation, Ionization, Laser optics, Laser induced damage, Thin films, Femtosecond phenomena, Absorption

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Proceedings Article | 28 November 2011 Paper

The impact ionization coefficient in dielectric materials revisited

C. Karras, Z. Sun, D. Nguyen, L. Emmert, W. Rudolph

Proceedings Volume 8190, 819028 (2011) https://doi.org/10.1117/12.899267

KEYWORDS: Ionization, Ultraviolet radiation, Absorption, Sapphire, Dielectrics, Data modeling, Silica, Picosecond phenomena, Multiphoton processes, Artificial intelligence

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Proceedings Article | 23 November 2011 Paper

Third harmonic microscopy for optical material characterization

R. Weber, C. Rodriguez, D. Nguyen, L. Emmert, W. Rudolph, D. Patel, C. Menoni

Proceedings Volume 8190, 81900V (2011) https://doi.org/10.1117/12.899265

KEYWORDS: Anisotropy, Microscopy, Silica, Nanoparticles, Interfaces, Gold, Optical materials characterization, Optical microscopy, Polarization, Laser induced damage

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Proceedings Article | 6 December 2010 Paper

Advances in ion beam sputtered Sc2O3 for optical interference coatings

Carmen Menoni, Erik Krous, Dinesh Patel, Peter Langston, Jonathan Tollerud, Duy Nguyen, Luke Emmert, Ashot Markosyan, Roger Route, Martin Fejer, Wolfgang Rudolph

Proceedings Volume 7842, 784202 (2010) https://doi.org/10.1117/12.855604

KEYWORDS: Laser induced damage, Ion beams, Sputter deposition, Oxygen, Scandium, Picosecond phenomena, Refractive index, Atomic force microscopy, Argon, Optical coatings

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Proceedings Article | 2 December 2010 Paper

Calculation and measurement of fs-LIDT of TixSi(1-x)O2-mixtures

M. Jupé, L. Jensen, M. Mende, D. Ristau, A. Melninkaitis, V. Sirutkaitis, D. Nguyen, L. Emmert, W. Rudolph

Proceedings Volume 7842, 78420Z (2010) https://doi.org/10.1117/12.867736

KEYWORDS: Electrons, Ionization, Silica, Absorption, Dielectrics, Pulsed laser operation, Coating, Oxides, Laser induced damage, Titanium dioxide

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Proceedings Article | 2 December 2010 Paper

The vacuum effect of femtosecond LIDT measurements on dielectric films

D. Nguyen, L. Emmert, W. Rudolph, D. Patel, C. Menoni

Proceedings Volume 7842, 78420V (2010) https://doi.org/10.1117/12.867996

KEYWORDS: Oxygen, Silica, Dielectrics, Femtosecond phenomena, Atomic layer deposition, Atmospheric optics, Nitrogen, Laser damage threshold, Ionization, Electrons

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Proceedings Article | 1 December 2010 Paper

Investigations on SiO2/HfO2 mixtures for nanosecond and femtosecond pulses

Lars Jensen, Mathias Mende, Holger Blaschke, Detlev Ristau, Duy Nguyen, Luke Emmert, Wolfgang Rudolph

Proceedings Volume 7842, 784207 (2010) https://doi.org/10.1117/12.867238

KEYWORDS: Composites, Laser damage threshold, Laser induced damage, Silica, Femtosecond phenomena, Optical coatings, Reflectors, Refraction, Absorption, Mirrors

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Proceedings Article | 29 November 2010 Paper

Femtosecond pulse S on 1 LIDT in dielectric materials: comparison of experiment and theory

L. Emmert, M. Mero, D. Nguyen, W. Rudolph, D. Patel, E. Krous, C. Menoni

Proceedings Volume 7842, 784211 (2010) https://doi.org/10.1117/12.868035

KEYWORDS: Ionization, Dielectrics, Laser damage threshold, Pulsed laser operation, Picosecond phenomena, Femtosecond phenomena, Absorption, Dielectric breakdown, Laser induced damage, Oxides

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Proceedings Article | 31 December 2009 Paper

The effect of nitrogen doping on the multiple-pulse subpicosecond dielectric breakdown of hafnia films

D. Nguyen, L. Emmert, W. Rudolph, D. Patel, E. Krous, C. Menoni

Proceedings Volume 7504, 750402 (2009) https://doi.org/10.1117/12.836504

KEYWORDS: Nitrogen, Laser damage threshold, Oxides, Hafnium, Doping, Electrons, Dielectric breakdown, Oxygen, Ions, Ionization

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Proceedings Article | 31 December 2009 Paper

Studies of femtosecond laser induced damage of HfO2 thin film in atmospheric and vacuum environments

D. Nguyen, L. Emmert, W. Rudolph, D. Patel, E. Krous, C. Menoni, M. Shinn

Proceedings Volume 7504, 750403 (2009) https://doi.org/10.1117/12.836505

KEYWORDS: Silica, Nitrogen, Femtosecond phenomena, Thin films, Laser damage threshold, Ionization, Free electron lasers, Dielectrics, Coating, Atmospheric optics

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Proceedings Article | 31 December 2009 Paper

Optimization of scandia thin films for high power laser coating applications

Erik Krous, Dinesh Patel, Ashot Markosyan, Duy Nguyen, Luke Emmert, Peter Langston, Roger Route, Martin Fejer, Wolfgang Rudolph, Michelle Shinn, Carmen Menoni

Proceedings Volume 7504, 750407 (2009) https://doi.org/10.1117/12.836915

KEYWORDS: Laser damage threshold, Oxygen, Coating, Ion beams, Refractive index, Absorption, Thin films, Sputter deposition, Thin film coatings, High power lasers

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Proceedings Article | 31 December 2009 Paper

Fundamental processes controlling the single and multiple femtosecond pulse damage behavior of dielectric oxide films

L. Emmert, D. Nguyen, M. Mero, W. Rudolph, D. Ristau, K. Starke, M. Jupé, C. Menoni, D. Patel, E. Krous

Proceedings Volume 7504, 75040P (2009) https://doi.org/10.1117/12.836508

KEYWORDS: Electrons, Ionization, Laser damage threshold, Oxides, Dielectrics, Laser induced damage, Absorption, Femtosecond phenomena, Pulsed laser operation, Picosecond phenomena

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Proceedings Article | 30 December 2008 Paper

The effect of annealing on the subpicosecond breakdown behavior of hafnia films

Duy Nguyen, Luke Emmert, Mark Mero, Wolfgang Rudolph, Dinesh Patel, Eric Krous, Carmen Menoni

Proceedings Volume 7132, 71320N (2008) https://doi.org/10.1117/12.804452

KEYWORDS: Annealing, Laser damage threshold, Absorption, Picosecond phenomena, Laser induced damage, Silica, Dielectrics, Optical coatings, High power lasers, Femtosecond phenomena

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Proceedings Article | 14 May 2008 Paper

Subpicosecond dielectric breakdown and incubation in TixSi1-xO2 composite films with adjustable bandgap

L. Emmert, D. Nguyen, I. Cravetchi, M. Mero, W. Rudolph, M. Jupe, M. Lappschies, K. Starke, D. Ristau

Proceedings Volume 7005, 70051V (2008) https://doi.org/10.1117/12.785154

KEYWORDS: Laser damage threshold, Composites, Oxides, Coating, Absorption, Refractive index, Dielectric breakdown, Ion beams, Laser induced damage, Femtosecond phenomena

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Proceedings Article | 18 December 2007 Paper

Experimental and theoretical studies of subpicosecond laser damage in TixSi1-xO2 composite films

D. Nguyen, I. Cravetchi, L. Emmert, W. Rudolph, M. Jupe, M. Lappschies, K. Starke, D. Ristau

Proceedings Volume 6720, 67200C (2007) https://doi.org/10.1117/12.753547

KEYWORDS: Composites, Laser induced damage, Oxides, Silicon, Laser damage threshold, Refractive index, Dielectrics, Coating, Absorption, Sputter deposition

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Showing 5 of 16 publications

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