Dr. Ellen D. Williams Profile

Dr. Ellen D. Williams

at Univ of Maryland College Park

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Author

Publications (3)

Proceedings Article | 13 September 2007 Paper

Transfer printing as a method for fabricating hybrid devices on flexible substrates

D. Hines, A. Southard, A. Tunnell, V. Sangwan, T. Moore, J.-H. Chen, M. Fuhrer, E. Williams

Proceedings Volume 6658, 66580Y (2007) https://doi.org/10.1117/12.739100

KEYWORDS: Printing, Gold, Electrodes, Silicon, Positron emission tomography, Dielectrics, Graphene, Polymethylmethacrylate, Polymers, Nanowires

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Proceedings Article | 22 August 2001 Paper

Silicon single atom steps as AFM height standards

Ronald Dixson, Ndubuisi Orji, Joseph Fu, Vincent Tsai, Ellen Williams, Raghu Kacker, Theodore Vorburger, Hal Edwards, Debra Cook, Paul West, Ralph Nyffenegger

Proceedings Volume 4344, (2001) https://doi.org/10.1117/12.436739

KEYWORDS: Silicon, Calibration, Atomic force microscopy, Oxides, Metrology, Statistical analysis, Chemical species, Standards development, Error analysis, Atomic force microscope

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Proceedings Article | 22 May 1995 Paper

Progress on accurate metrology of pitch, height, roughness, and width artifacts using an atomic force microscope

Jason Schneir, Thomas McWaid, Ronald Dixson, Vincent Tsai, John Villarrubia, Ellen Williams, E. Fu

Proceedings Volume 2439, (1995) https://doi.org/10.1117/12.209224

KEYWORDS: Calibration, Metrology, Atomic force microscopy, Surface roughness, Interferometers, Atomic force microscope, Standards development, Polarization, Capacitance, Digital signal processing

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