Eugen Dumitrescu
Managing Director at TRIOPTICS GmbH
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 6 October 2017 Paper
Proceedings Volume 10433, 104331D (2017) https://doi.org/10.1117/12.2275308
KEYWORDS: Modulation transfer functions, Temperature metrology, Thermography, Infrared imaging, Infrared sensors, Distortion, Optics manufacturing, Optical testing, Staring arrays, Mid-IR

Proceedings Article | 18 June 2013 Paper
Proceedings Volume 8704, 87042D (2013) https://doi.org/10.1117/12.2015679
KEYWORDS: Lenses, Autocollimators, Interferometers, Silicon, Infrared imaging, Infrared lenses, Optics manufacturing, Long wavelength infrared, Error analysis, Reticles

Proceedings Article | 24 October 2012 Paper
Daniel Winters, Patrik Erichsen, Christian Domagalski, Frank Peter, Josef Heinisch, Eugen Dumitrescu
Proceedings Volume 8541, 854105 (2012) https://doi.org/10.1117/12.974957
KEYWORDS: Modulation transfer functions, Cameras, Long wavelength infrared, Infrared imaging, Thermography, Sensors, Staring arrays, Image quality, Imaging systems, Infrared cameras

Proceedings Article | 15 February 2012 Paper
Proceedings Volume 8249, 82490U (2012) https://doi.org/10.1117/12.908727
KEYWORDS: Lenses, Autocollimators, Optical components, Distance measurement, Optical alignment, Interferometers, Geometrical optics, Mirrors, Optics manufacturing, Cements

Proceedings Article | 15 February 2011 Paper
Proceedings Volume 7926, 79260E (2011) https://doi.org/10.1117/12.874628
KEYWORDS: Interferometers, Imaging systems, Autocollimators, Error analysis, Objectives, Optical components, Cell phones, Optical alignment, Optics manufacturing, Refractive index

Proceedings Article | 29 August 2008 Paper
Proceedings Volume 7060, 70600T (2008) https://doi.org/10.1117/12.794467
KEYWORDS: Wavefronts, Semiconducting wafers, Wavefront sensors, Sensors, Light sources, Optical testing, Modulation transfer functions, Wafer-level optics, Aspheric optics, Aspheric lenses

Proceedings Article | 14 May 2007 Paper
Proceedings Volume 10316, 1031611 (2007) https://doi.org/10.1117/12.719838
KEYWORDS: Lenses, Telescopes, Ultraviolet radiation, Autocollimation, Tolerancing, Error analysis, Reticles, Manufacturing, Objectives, Optical alignment

Proceedings Article | 14 May 2007 Paper
Proceedings Volume 10316, 1031610 (2007) https://doi.org/10.1117/12.719697
KEYWORDS: Objectives, Lenses, Optical components, Autocollimators, Optics manufacturing, Precision measurement, Error analysis, Optical imaging, Optical alignment

Proceedings Article | 14 May 2007 Paper
Proceedings Volume 10316, 103160Y (2007) https://doi.org/10.1117/12.719656
KEYWORDS: Modulation transfer functions, Cameras, Sensors, CCD cameras, CCD image sensors, Imaging systems, Software development, CMOS sensors, Image analysis, Standards development

Proceedings Article | 1 September 2006 Paper
Proceedings Volume 6288, 628810 (2006) https://doi.org/10.1117/12.693356
KEYWORDS: Lenses, Objectives, Autocollimators, Cell phones, Digital cameras, Optical components, Optical spheres, Cameras, Measurement devices, Optical testing

Proceedings Article | 11 November 2002 Paper
Proceedings Volume 4779, (2002) https://doi.org/10.1117/12.451713
KEYWORDS: Semiconducting wafers, Measurement devices, Spatial frequencies, Distance measurement, Interferometers, Reconstruction algorithms, Algorithm development, Sensors, Wafer-level optics, Deflectometry

Showing 5 of 11 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top