Dr. Eugene G. Bortchagovsky Profile

Dr. Eugene G. Bortchagovsky

Senior Scientific Researcher at Institute of Semiconductor Physics

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 19 May 2011 Paper

Model for the effective medium approximation of nanostructured layers with the account of interparticle interactions

Eugene Bortchagovsky, Valeri Lozovski, Tetiana Mishakova

Proceedings Volume 8070, 807018 (2011) https://doi.org/10.1117/12.887248

KEYWORDS: Particles, Polarizability, Dielectrics, Optical properties, Dielectric polarization, Polarization, Nanostructuring, Magnesium, Nanoparticles, Composites

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Proceedings Article | 7 May 2011 Paper

Simulation of the response of the optical sensor based on the local plasmons in the layer of nanoparticles

Eugene Bortchagovsky, Valeri Lozovski, Tetiana Mishakova

Proceedings Volume 8073, 807319 (2011) https://doi.org/10.1117/12.886261

KEYWORDS: Particles, Nanoparticles, Sensors, Optical sensors, Spherical lenses, Polarizability, Plasmons, Adsorption, Dielectrics, Gold

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Proceedings Article | 1 April 2003 Paper

Transmission spectra of systems with thin films: classical analog of the Fano effect

Eugene Bortchagovsky, U. Fischer

Proceedings Volume 5064, (2003) https://doi.org/10.1117/12.501383

KEYWORDS: Dielectrics, Reflection, Absorption, Gold, Thin films, Molecules, Metals, Phase shifts, Glasses, Polarizability

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Proceedings Article | 10 August 2001 Paper

Comparison of ellipsometric methods for separate determination of thickness and optical constants of thin films

Eugene Bortchagovsky, O. Getsko

Proceedings Volume 4517, (2001) https://doi.org/10.1117/12.435962

KEYWORDS: Thin films, Refractive index, Silicon films, Dielectrics, Silicon, Ellipsometry, Absorption, Surface plasmons, Liquids, Waveguide modes

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Proceedings Article | 20 April 1998 Paper

Random error behavior for rotating-analyzer ellipsometers

Eugene Bortchagovsky

Proceedings Volume 3359, (1998) https://doi.org/10.1117/12.306258

KEYWORDS: Polarizers, Sensors, Solids, Silicon, Dielectrics, Gold, Dispersion, Light, Ellipsometry, Light sources

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Proceedings Article | 20 April 1998 Paper

Fullerene-embedded Langmuir-Blodgett films probed by spectroscopic ellipsometry

Eugene Bortchagovsky, Igor Yurchenko, Zoya Kazantseva, Josef Humlicek, Jaroslav Hora

Proceedings Volume 3359, (1998) https://doi.org/10.1117/12.306243

KEYWORDS: Gold, Fullerenes, Ellipsometry, Surface plasmons, Dielectrics, Optical properties, Spectroscopic ellipsometry, Data modeling, Thin films, Glasses

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