Dr. Fei Wang Profile

Dr. Fei Wang

at Harbin Institute of Technology

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Publications (5)

Proceedings Article | 15 March 2019 Paper

Pruning filters with L1-norm and standard deviation for CNN compression

Xinlu Sun, Dianle Zhou, Xiaotian Pan, Zhiwei Zhong, Fei Wang

Proceedings Volume 11041, 110412J (2019) https://doi.org/10.1117/12.2523246

KEYWORDS: Neurons, Convolution, Multilayers, Neural networks, Field programmable gate arrays, Databases, Defense technologies, Machine vision, Computer vision technology, Mobile devices

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Proceedings Article | 29 October 2018 Paper

A complementary tracking model with multiple features

Peng Gao, Yipeng Ma, Chao Li, Ke Song, Fei Wang, Liyi Xiao

Proceedings Volume 10836, 1083618 (2018) https://doi.org/10.1117/12.2500635

KEYWORDS: Digital image correlation and tracking, Information fusion, Detection and tracking algorithms

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Proceedings Article | 6 July 2015 Paper

Implementation of weighted summation type fractional Fourier transform on FPGA

Qiming Zou, Longlong Li, Qian Huang, Fei Wang

Proceedings Volume 9631, 963125 (2015) https://doi.org/10.1117/12.2197111

KEYWORDS: Fractional fourier transform, Field programmable gate arrays, Transform theory, Image processing, Computer architecture, Logic, Signal processing, Image encryption, Commercial off the shelf technology, Fourier transforms

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Proceedings Article | 21 October 2009 Paper

Frequency shift of piezoelectric microcantilever humidity sensors

Fei Wang

Proceedings Volume 7493, 74936P (2009) https://doi.org/10.1117/12.840104

KEYWORDS: Sensors, Humidity, Analytical research, Microfluidics, Microelectromechanical systems, Fluid dynamics, Electronics engineering, Composites, Atomic force microscopy, Molecules

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Proceedings Article | 25 August 2009 Paper

Determination of Young's modulus for microcantilevers in atomic force microscopy

Fei Wang, Xuezeng Zhao

Proceedings Volume 7375, 737538 (2009) https://doi.org/10.1117/12.839247

KEYWORDS: Atomic force microscopy, Microfluidics, Silicon, Sensors, Finite element methods, Testing and analysis, Numerical simulations, Atomic force microscope, Numerical analysis, Scanning electron microscopy

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