Dr. Ferenc Riesz
Senior Research Fellow at Research Inst for Tech Physics & Materials Science
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Publications (7)

Proceedings Article | 27 May 2011 Paper
Proceedings Volume 8082, 80822I (2011) https://doi.org/10.1117/12.888968
KEYWORDS: Speckle, Speckle pattern, Diffraction, Semiconductors, Semiconducting wafers, Coherence (optics), Surface roughness, Mirrors, Silicon, Light sources

Proceedings Article | 17 June 2009 Paper
Proceedings Volume 7389, 73892M (2009) https://doi.org/10.1117/12.827337
KEYWORDS: Surface finishing, Semiconducting wafers, Mirrors, Silicon, Polishing, Geometrical optics, Reflection, Inspection, Semiconductors, Collimation

Proceedings Article | 18 June 2007 Paper
Ferenc Riesz, I. Lukács, J. Makai
Proceedings Volume 6616, 66160L (2007) https://doi.org/10.1117/12.726388
KEYWORDS: Digital micromirror devices, Mirrors, Interferometry, Cameras, Semiconducting wafers, Photomasks, Optical components, Off axis mirrors, Collimation, Geometrical optics

Proceedings Article | 17 August 2004 Paper
Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.546018
KEYWORDS: Semiconducting wafers, Silicon, Microelectromechanical systems, Diffraction, Wafer-level optics, Mirrors, Cameras, Geometrical optics, Reflection, Polishing

Proceedings Article | 19 August 1998 Paper
Proceedings Volume 3573, (1998) https://doi.org/10.1117/12.320948
KEYWORDS: Lawrencium, Monte Carlo methods, Light sources, Semiconducting wafers, Cameras, Imaging systems, Geometrical optics, Optical simulations, Mirrors, Information operations

Showing 5 of 7 publications
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