Dr. Frank V. Belanger
Research Engineer at Entegris Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 5 April 2007 Paper
Anatoly Grayfer, Frank Belanger, Phillip Cate, David Ruede
Proceedings Volume 6518, 651842 (2007) https://doi.org/10.1117/12.712208
KEYWORDS: Silicon, Digital filtering, Adsorption, Calibration, Contamination, Chemical analysis, Optical components, Lithography, Semiconductor manufacturing, Carbon

Proceedings Article | 5 April 2007 Paper
Oleg Kishkovich, Anatoly Grayfer, Frank Belanger
Proceedings Volume 6518, 65183R (2007) https://doi.org/10.1117/12.712325
KEYWORDS: Reticles, Air contamination, Pellicles, Photomasks, Quartz, Manufacturing, Chromium, Scanners, Contamination, Humidity

Proceedings Article | 12 May 2005 Paper
F. Belanger, P. Cate, A. Grayfer, R. Petersen, D. Ruede
Proceedings Volume 5754, (2005) https://doi.org/10.1117/12.610665
KEYWORDS: Silicon, Contamination, Optical filters, Scanners, Head-mounted displays, Absorption, Optical lithography, Photoresist materials, Chemical analysis, Chemical elements

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