Prof. Giancarlo V. de Faria
at PUC-Rio
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 May 2011 Paper
Iakyra Couceiro, Thiago Ferreira da Silva, Luiz V. G. Tarelho, Carlos L. S. Azeredo, Igor Malinovski, Hans P. H. Grieneisein, Wellington Barros, Giancarlo Faria, Jean von der Weid, Marcello Amaral, Marcus Raele, Anderson de Freitas
Proceedings Volume 8082, 80822P (2011) https://doi.org/10.1117/12.889404
KEYWORDS: Optical coherence tomography, Calibration, Interferometers, Standards development, Microscopes, Coherence (optics), Software development, Surface roughness, Tomography, Michelson interferometers

Proceedings Article | 27 May 2011 Paper
T. Ferreira da Silva, J. Ferreira, G. Borghi, T. Menegotto, G. Vilela de Faria, J. P. von der Weid
Proceedings Volume 8082, 80822U (2011) https://doi.org/10.1117/12.889437
KEYWORDS: Polarization, Interferometry, Optical fibers, Picosecond phenomena, Geometrical optics, Mirrors, Crystals, Metrology, Poincaré sphere, Interferometers

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