This paper presents a methodology for providing traceability to OCT measurements linked to Length SI unit.
The link to primary length standard is provided by an interference microscope (IM). The chosen transfer standard was a
step height gauge block. The results for IM and OCT showed good agreement for step height standards, such that the
OCT will be able to perform reliable measurements of complex surface topographies and to ensure traceability to the
length scale. The main uncertainty components were evaluated for the OCT system. In addition, OCT also was used for
measuring a surface roughness standard -a depth standard - in order to test this methodology for round groove profiles.
Results were found to be in good agreement with the calibration certificate.
Polarization modes dispersion (PMD) is one of the major factors that impose restrictions in the speed of optical
communication links and some efforts must be done in order to properly quantify this effect. In this way we develop
studies on the behavior of such a phenomenon, critical when light is transmitted through long optical fibers. The focus in
this paper is to discuss the different behavior of PMD over different wavelengths ranges. Results indicate that PMD
value varies, depending on the spectral region covered by the optical source. Measurements were performed using the
interferometric method on three different types of optical fiber with three broadband optical sources covering the infrared
spectral bands O, S, C and L. The evaluation of mean PMD is also discussed in the metrology concepts.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.