Dr. Gideon Reisfeld
Physicist at Intel Israel (74) Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2008 Paper
Gideon Reisfeld, Dmitry Messerman, Nir Bone, Adi Lazar
Proceedings Volume 6925, 69250L (2008) https://doi.org/10.1117/12.777269
KEYWORDS: Failure analysis, Device simulation, Computer aided design, Computer simulations, Transistors, Binary data, Data modeling, Testing and analysis, Critical dimension metrology, Very large scale integration

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