Dr. Göran A. Johansson Profile

Dr. Göran A. Johansson

Optical Systems Engineer at Teledyne FLIR Systems AB

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Publications (6)

Proceedings Article | 11 September 2014 Paper

Liquid-metal-jet x-ray tube technology and tomography applications

Emil Espes, Tommy Andersson, Fredrik Björnsson, Christina Gratorp, Björn Hansson, Oscar Hemberg, Göran Johansson, Johan Kronstedt, Mikael Otendal, Tomi Tuohimaa, Per Takman

Proceedings Volume 9212, 92120J (2014) https://doi.org/10.1117/12.2061612

KEYWORDS: X-rays, Indium, Tomography, Gallium, X-ray sources, X-ray technology, X-ray imaging, Metals, Electrons, Liquids

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Proceedings Article | 7 September 2006 Paper

Chemically sensitive 3D imaging at sub-100-nm spatial resolution using tomography in a scanning transmission x-ray microscope

Göran Johansson, James Dynes, Adam Hitchcock, Tolek Tyliszczak, George Swerhone, John Lawrence

Proceedings Volume 6318, 63181I (2006) https://doi.org/10.1117/12.681217

KEYWORDS: Tomography, X-rays, X-ray imaging, Spatial resolution, Microscopes, Proteins, Capillaries, Computed tomography, Chemical analysis, X-ray microscopy

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SPIE Journal Paper | 1 November 2002

Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition

Fredrik Eriksson, Goeran Johansson, Hans Hertz, Jens Birch

OE, Vol. 41, Issue 11, (November 2002) https://doi.org/10.1117/12.10.1117/1.1510750

KEYWORDS: Reflectivity, Ions, X-rays, Interfaces, Argon, Chromium, Hard x-rays, Plasma, Sputter deposition, Mirrors

Proceedings Article | 20 December 2001 Paper

Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition

Fredrik Eriksson, Goeran Johansson, Hans Hertz, Jens Birch

Proceedings Volume 4506, (2001) https://doi.org/10.1117/12.450948

KEYWORDS: Ions, Reflectivity, X-rays, Interfaces, Argon, Multilayers, Plasma, Hard x-rays, Chromium, Sputter deposition

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Proceedings Article | 2 November 2000 Paper

Accurate multilayer period determination with laser plasma water-window reflectometer

Goeran Johansson, Magnus Berglund, Fredrik Eriksson, Jens Birch, Hans Hertz

Proceedings Volume 4144, (2000) https://doi.org/10.1117/12.405907

KEYWORDS: Reflectometry, Mirrors, X-rays, Multilayers, Error analysis, Data analysis, X-ray detectors, Computing systems, Reflection, Reflectivity

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Proceedings Article | 29 September 1999 Paper

Normal-incidence condenser mirror arrangement for compact water-window x-ray microscopy

Hans Hertz, Lars Rymell, Magnus Berglund, Goeran Johansson, Thomas Wilhein, Yuriy Platonov, David Broadway

Proceedings Volume 3766, (1999) https://doi.org/10.1117/12.363641

KEYWORDS: Mirrors, Reflectivity, Spherical lenses, Microscopes, X-ray microscopy, X-rays, Plasmas, Zone plates, Charge-coupled devices, X-ray optics

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Showing 5 of 6 publications

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