Dr. Guiju Song
at GE Research
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 14 May 2015 Paper
Xu Han, Guangping Xie, Brandon Laflen, Ming Jia, Guiju Song, Kevin Harding
Proceedings Volume 9489, 948907 (2015) https://doi.org/10.1117/12.2177281
KEYWORDS: Mirrors, Feature extraction, Metrology, Inspection, Profiling, Collimation, Charge-coupled devices, CCD image sensors, Calibration, Cameras

Proceedings Article | 14 May 2015 Paper
Proceedings Volume 9489, 94890L (2015) https://doi.org/10.1117/12.2176636
KEYWORDS: Sensors, Inspection, Fiber optics sensors, Computer aided design, Solid modeling, Image sensors, Image analysis, 3D modeling, Structured optical fibers, Inspection equipment

Proceedings Article | 18 August 2014 Paper
Kevin Harding, Jiajun Gu, Li Tao, Guiju Song, Jie Han
Proceedings Volume 9204, 92040Q (2014) https://doi.org/10.1117/12.2063742
KEYWORDS: Inspection, Video, Cameras, Filtering (signal processing), Feature extraction, Video processing, Detection and tracking algorithms, Motion analysis, Binary data, Resistance

Proceedings Article | 20 November 2012 Paper
Proceedings Volume 8563, 85630N (2012) https://doi.org/10.1117/12.2000462
KEYWORDS: Optical coherence tomography, Composites, Inspection, Manufacturing, Process control, Carbon, Metrology, Interferometry, Imaging systems, Sensors

Proceedings Article | 11 November 2010 Paper
Li Tao, Kevin Harding, Ming Jia, Guiju Song
Proceedings Volume 7855, 78550Y (2010) https://doi.org/10.1117/12.872022
KEYWORDS: Calibration, Image enhancement, 3D metrology, Image filtering, Image processing, Charge-coupled devices, Inspection, Sensors, 3D image processing, Structured light

Showing 5 of 10 publications
Conference Committee Involvement (5)
Dimensional Optical Metrology and Inspection for Practical Applications II
25 August 2013 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications
22 August 2011 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications
18 October 2010 | Beijing, China
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Two- and Three-Dimensional Methods for Inspection and Metrology VI
10 August 2008 | San Diego, California, United States
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