Prof. H. F. van Beek
at Van Beek Consultancy
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 17 September 2012 Paper
A. Benz, S. Krucker, G. Hurford, N. Arnold, P. Orleanski, H.-P. Gröbelbauer, S. Klober, L. Iseli, H. Wiehl, A. Csillaghy, L. Etesi, N. Hochmuth, M. Battaglia, M. Bednarzik, R. Resanovic, O. Grimm, G. Viertel, V. Commichau, A. Meuris, O. Limousin, S. Brun, N. Vilmer, K. Skup, R. Graczyk, M. Stolarski, M. Michalska, W. Nowosielski, A. Cichocki, M. Mosdorf, K. Seweryn, A. Przepiórka, J. Sylwester, M. Kowalinski, T. Mrozek, P. Podgorski, G. Mann, H. Aurass, E. Popow, H. Önel, F. Dionies, S. Bauer, J. Rendtel, A. Warmuth, M. Woche, D. Plüschke, W. Bittner, J. Paschke, D. Wolker, H. Van Beek, F. Farnik, J. Kasparova, A. Veronig, I. Kienreich, P. Gallagher, D. Bloomfield, M. Piana, A. Massone, B. Dennis, R. Schwarz, R. Lin
Proceedings Volume 8443, 84433L (2012) https://doi.org/10.1117/12.927793
KEYWORDS: Sensors, X-rays, Imaging systems, Solar energy, Hard x-rays, X-ray imaging, X-ray telescopes, Electrons, Electronics, Space telescopes

Proceedings Article | 2 November 1998 Paper
Robert Lin, Gordon Hurford, Norman Madden, Brian Dennis, Carol Crannell, Gordon Holman, Reuven Ramaty, Tycho von Rosenvinge, Alex Zehnder, H. Frank van Beek, Patricia Bornmann, Richard Canfield, A. Gordon Emslie, Hugh Hudson, Arnold Benz, John Brown, Shinzo Enome, Takeo Kosugi, Nicole Vilmer, David Smith, Jim McTiernan, Isabel Hawkins, Said Slassi-Sennou, Andre Csillaghy, George Fisher, Chris Johns-Krull, Richard Schwartz, Larry Orwig, Dominic Zarro, Ed Schmahl, Markus Aschwanden, Peter Harvey, David Curtis, David Pankow, David Clark, Robert Boyle, Reinhold Henneck, Akilo Michedlishvili, Knud Thomsen, Jeff Preble, Frank Snow
Proceedings Volume 3442, (1998) https://doi.org/10.1117/12.330245
KEYWORDS: Electrons, Imaging spectroscopy, Solar energy, X-rays, Spatial resolution, Space operations, Sensors, Hard x-rays, Ions, Sun

Proceedings Article | 4 October 1994 Paper
Proceedings Volume 2270, (1994) https://doi.org/10.1117/12.188833
KEYWORDS: X-rays, Sensors, X-ray imaging, Manufacturing, Modulation, Gamma radiation, Optics manufacturing, Collimation, Gamma ray imaging, Crystallography

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