Considering the change of optical information on material surface, this paper proposes a useful notion called pixel-level
optical constants (POC). Through Fresnel equations, traditional optical constants (refractive index n and extinction
coefficient k ) can reflect photoelectric characteristics on material surface. Combining with Mueller calculus in
polarization optics, POC can describe the distrbution of photoelectric characteristics on material surface. POC is mainly
calculated by the decomposition of Mueller matrix which includes Fresnel amplitude, ratio of two orthogonal reflection
coefficient component P and variation of phase difference between incident light and reflected light Δ . With the
regularity of polarized light and the statistics of Mueller matrices, optical characteristics can be detailed to each pixel in
POC, which will independently show the distribution of polarization characteristics on material surface. And it can also be
approximately averaged to obtain traditional optical constants. So POC is significant to optical researches on material
surface.
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