Hector Q. Gonzalez Muñoz
at Ctr Nacional de Metrologia
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 November 2003 Paper
Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503865
KEYWORDS: Calibration, Image processing, CCD cameras, Refractive index, Interferometers, Microscopes, Control systems, Image filtering, Interferometry, Software development

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