Ms. Hehong Fan Profile

Hehong Fan

at Southeast Univ

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Proceedings Article | 17 April 2020 Paper

Failure mechanism analysis for a state-convertible SLD failure mode

Shaokai Wang, Hehong Fan, Xiaohan Sun

Proceedings Volume 11455, 1145550 (2020) https://doi.org/10.1117/12.2565009

KEYWORDS: Failure analysis, Reliability, Ions, Nondestructive evaluation, Semiconductor lasers, Diodes, Optical coherence tomography, Fiber optic gyroscopes, Light sources

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Super luminescent diodes (SLDs) have wide spectrum and high output optical power, which are widely used in area of optical fiber sensing, optical coherence tomography (OCT) and fiber optic gyroscope (FOG), etc. As a high power light source, its failure analysis is of great significance to improve its reliability especially for field use. In this paper, we introduced a special failure mode we found in a nondestructive failure analysis process for failed SLDs, and our mechanism analysis about it. When we used an adjustable constant current source circuit to perform an electrical test on two failed SLDs, a state-convertible SLD failure mode was found. The failure mode can be represented by voltage-current and voltage-time curve of the SLDs. The failed SLDs show to have two different failure states, i.e. resistive state and illuminating state. And the SLDs can transfer from one state to another state by applying certain voltages. To explain this phenomenon we proposed a failure mechanism based on assumption of movable ions in crystal defect and induced-channel effect.

Proceedings Article | 2 October 2006 Paper

Reliability evaluation model for multi-states WDM networks

Hehong Fan, Xiaohan Sun

Proceedings Volume 6387, 638705 (2006) https://doi.org/10.1117/12.685848

KEYWORDS: Wavelength division multiplexing networks, Reliability, Optical networks, Optical components, Channel projecting optics, Monte Carlo methods, Binary data, Systems modeling, Transponders, Composites

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With optical networks evolving to the next generation optical networks, various services are intended to be carried over a single optical network infrastructure. This contributes to the phenomenon that different services with different QoS requirements may survive in a set of degradative network working-states. Thus during the study of optical network reliability, it is insufficient to regard optical networks as having only binary working-states according to their network connectivity. We proposes here a new reliability evaluation model for WDM networks, which regard the network as a system having multiple working-states with reference to their route (s-t) capacity and maximum hop number constraints. Additionally, considering that there exist in WDM networks some elements whose failures affect neither the nodes nor the entire links but only certain wavelength channels in the links, a new kind of network element is added to the traditional element types (nodes and links) of network reliability evaluation model, namely wavelength channel related elements. The model was used to simulate the reliability of WC (wavelength continuous), PWC (partial wavelength conversion) and NWC (non-wavelength continuous) WDM networks with CERNET topology by way of Monte-Carlo method. Simulation results indicate that different working-state requirements may lead to different reliability evaluation results, and the differences will enlarge very quickly with the increasing of network element failure rates. This implies that the study of WDM network reliability should be performed under multiple working-states assumption, especially for multi-service networks, and the addition of the new network element kind - a wavelength channel-related element is necessary.

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