The dye coating is the most important process in CD-R replication technique, because the coating result has a significant effect on the final disc quality. Optical density (OD) curve represents the result of dye coating. In this paper an optical density curve model for dye coating is discussed. It can be used as an analysis tool of many important parameters in the coating process, thereby control the disc quality. The optical density curve of the disc after coating is measured with the Dr Schenk and then divided into several sections to line-fitting. The new curve has 4 characteristic points and 3 characteristic line sections, which can be used to make process analysis.
Basing on the structure of multi-layer parallel-accessed disc, current modulation code is optimized to achieve higher density storage. Two problems, which may be serious after the optimization, are discussed: acceptable jitter and synchronization process of PLL. A novel method for procuring combined signal of channel bit clock for multi-layer disc is proposed, which satisfies the requirements of PLL. The novel method is at last proved by probabilistic theory. At the end of this paper, parameters of RLL for multi-layer disc are presented: d=4, k=10~15. These new parameters improve the track-density by 15% ~ 20%.
A theoretical model for CD-R dye coating on a substrate with spiral pre-groove is presented. A typical CD-R dye coating process consists of three stages: dispensing stage, spreading stage and vaporizing stage. Some assumptions and simplification for every stage are made and the second stage is mainly analyzed. The motion equation, boundary equations and continuity equation of flow for dye film are derived, taking into account topography on substrate and interface slip between liquid and substrate. Finally the governing equation is given.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.