CONFERENCE PROCEEDINGS
Advanced Search
Hongzhen Chen
at Institute of Electronics
SPIE Involvement:
Author
Publications (1)
SPIE Journal Paper | 20 September 2012
Analysis of geometric property of building double-reflection in high-resolution SAR images and its application to height retrieval
Hongzhen Chen, Yueting Zhang, Hongqi Wang, Chibiao Ding
JARS, Vol. 6, Issue 01, 063555, (September 2012) https://doi.org/10.1117/12.10.1117/1.JRS.6.063555
KEYWORDS: Synthetic aperture radar, Scattering, Sensors, Device simulation, Error analysis, 3D modeling, Commercial off the shelf technology, Radar, Backscatter, Interferometric synthetic aperture radar
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top