Ms. Hyemin Yoo Profile

Hyemin Yoo

at Wyant College of Optical Sciences

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Publications (5)

Proceedings Article | 28 September 2023 Presentation + Paper

Comparing novel and conventional methods for optical system alignment using deflectometry

Hyemin Yoo, Matthew Dubin

Proceedings Volume 12669, 1266904 (2023) https://doi.org/10.1117/12.2677601

KEYWORDS: Deflectometry, Calibration, Wavefront errors, Optical alignment, Wavefront aberrations, Zemax, Imaging systems

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Proceedings Article | 3 October 2022 Presentation + Paper

Impact of the LCD monitor locations on a novel alignment method: the combination of deflectometry and the sine condition test

Hyemin Yoo, Matthew Dubin

Proceedings Volume 12222, 1222206 (2022) https://doi.org/10.1117/12.2639735

KEYWORDS: Telescopes, Monochromatic aberrations, LCDs, Deflectometry, Cameras, Device simulation, Signal to noise ratio, Optical alignment, Brain-machine interfaces, Sensors

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Proceedings Article | 20 August 2020 Presentation

Return flat-free telescope alignment using sine condition test and deflectometry

Hyemin Yoo, Matthew Dubin

Proceedings Volume 11488, 114880M (2020) https://doi.org/10.1117/12.2571484

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Proceedings Article | 7 April 2020 Paper

Reconfigurable dynamic optical system design, test, and data analysis

Dae Wook Kim, Maham Aftab, Isaac Trumper, Logan Graves, Henry Quach, Hyukmo Kang, Hyemin Yoo, Andrew Lowman, Greg Smith, Matt Dubin, Chang-Jin Oh, Justin Hyatt, Christian Davila-Peralta, Heejoo Choi

Proceedings Volume 11352, 1135202 (2020) https://doi.org/10.1117/12.2555650

KEYWORDS: Deflectometry, Freeform optics, Optical testing, Optical design, Optics manufacturing, Infrared radiation, Metrology, Data analysis, Mirrors

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Proceedings Article | 14 September 2018 Presentation + Paper

Improvements in the scanning long-wave optical test system

Hyemin Yoo, Greg Smith, Chang Jin Oh, Andrew Lowman, Matthew Dubin

Proceedings Volume 10742, 1074216 (2018) https://doi.org/10.1117/12.2321265

KEYWORDS: Mirrors, Interferometry, Optical testing, Optical scanning systems, Deflectometry, Polishing

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