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Ilona Leanela Sitnitsky
Student at SUNY CNSE/SUNYIT
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Publications (1)
Proceedings Article | 15 September 2010 Paper
Conductive carbon nanotubes for semiconductor metrology
Victor Vartanian, Paul McClure, Vladimir Mancevski, Joseph Kopanski, Philp Rack, Ilona Sitnitsky, Matthew Bresin, Vince LaBella, Kathleen Dunn
Proceedings Volume 7767, 77670F (2010) https://doi.org/10.1117/12.861315
KEYWORDS: Resistance, Particle filters, Silicon, Metrology, Scanning probe microscopy, Scanning tunneling microscopy, Metals, Etching, Capacitance, Transmission electron microscopy
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