Mr. Jair A. Vallejos Profile

Jair A. Vallejos

at Univ Señor de Sipán

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 1 August 2021 Poster + Presentation + Paper

New method for digitization and manipulation of textile molds based on image processing

Heber Mejia-Cabrera, Jair Vallejos, Victor Tuesta-Monteza, Manuel Forero

Proceedings Volume 11842, 118422B (2021) https://doi.org/10.1117/12.2594314

KEYWORDS: Image segmentation, Image processing, Digital image processing, Corner detection, Shape analysis, Photography, Edge detection

Read Abstract +

The micro and small garment industries use traditional molds based on drawings on paper for the cutting of the fabric. This process is performed manually at the discretion of the operator, generating material loss during the cutting process. To make this task more efficient and reduce losses, this paper presents a technique for editing and vectorization of physical molds using digital image processing techniques, allowing the edition, modification or multiplication of the selected mold. For this purpose, a simple, low-cost device was developed to take photographs of the molds and an automatic method for contour detection and vectorization of textile molds was realized. Three edge detection methods, Sobel, Canny - Deriche and morphological gradient, were compared. Then, the Harris corner detection method was used, achieving a better detection, reducing the number of false corners, by using the image in gray levels as the input of the detector. The shapes of the contours between the corners were approximated by cubic splines, obtaining an analytical representation of each mold, being used to manipulate the size and position to place it in a better way on the fabric, achieving a significant reduction in fabric losses. The developed low-cost application thus allows the approximation of the models by vectorial representation, allowing their manipulation in an easy way and with a low consumption of computational resources without losing important information of the molds. The molds can thus be moved, rotated and scaled to accommodate them within the available fabric space.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years