Dr. James C. Jafolla Profile

Dr. James C. Jafolla

SPIE Involvement:

Author

Publications (13)

Proceedings Article | 22 April 2009 Paper

Measurement and analysis of optical surface properties for input to ShipIR

David Vaitekunas, Jim Jafolla, Paul McKenna, Martin Szczesniak

Proceedings Volume 7300, 73000M (2009) https://doi.org/10.1117/12.820055

KEYWORDS: Reflectivity, Bidirectional reflectance transmission function, High dynamic range imaging, Surface properties, Data modeling, Surface roughness, Thermal modeling, Reflection, Analytical research, System on a chip

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Proceedings Article | 17 September 2007 Paper

Two evolutionary algorithms optimize clusters and automate feature selection in multispectral images

George Burgin, H. Price Kagey, James Jafolla

Proceedings Volume 6700, 67000E (2007) https://doi.org/10.1117/12.732211

KEYWORDS: Distance measurement, Evolutionary algorithms, Mahalanobis distance, Multispectral imaging, Detection and tracking algorithms, Feature selection, Pattern recognition, Target recognition, Image analysis, Algorithm development

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Proceedings Article | 5 August 2004 Paper

Bidirectional reflectance measurements for high-resolution signature modeling

James Jafolla, William Reynolds

Proceedings Volume 5431, (2004) https://doi.org/10.1117/12.548085

KEYWORDS: Bidirectional reflectance transmission function, Scattering, Data modeling, Reflectivity, Light scattering, High dynamic range imaging, Systems modeling, Multiple scattering, Reflectometry, Databases

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Proceedings Article | 14 August 2002 Paper

Two optical methods for vehicle tagging

John Coulter, Christopher Klein, James Jafolla

Proceedings Volume 4708, (2002) https://doi.org/10.1117/12.479327

KEYWORDS: Near infrared, Coating, Surveillance, Long wavelength infrared, Semiconductor lasers, Thermography, Glasses, Polarizers, Imaging systems, Adhesives

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Proceedings Article | 17 January 2002 Paper

Hyperspectral sensor test bed for real-time algorithm evaluation

James Jafolla, Mark Dombrowski

Proceedings Volume 4480, (2002) https://doi.org/10.1117/12.453358

KEYWORDS: Detection and tracking algorithms, Automatic target recognition, Optical filters, Image filtering, Sensors, Hyperspectral imaging, Binary data, RGB color model, Image processing, Spatial filters

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Proceedings Article | 24 July 2000 Paper

Radiometric spectral and band rendering of targets using anisotropic BRDFs and measured backgrounds

John Hilgers, Jeffrey Hoffman, William Reynolds, James Jafolla

Proceedings Volume 4029, (2000) https://doi.org/10.1117/12.392530

KEYWORDS: Bidirectional reflectance transmission function, Reflectivity, Data modeling, Databases, Optical coatings, Spectral models, Panoramic photography, Computer simulations, Visualization, Affine motion model

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Proceedings Article | 14 July 1999 Paper

Theory and measurement of bidirectional reflectance for signature analysis

James Jafolla, David Thomas, John Hilgers, William Reynolds, Chris Blasband

Proceedings Volume 3699, (1999) https://doi.org/10.1117/12.352935

KEYWORDS: Bidirectional reflectance transmission function, Scattering, Data modeling, Reflectivity, Light scattering, Systems modeling, Sensors, Polarization, High dynamic range imaging, Multiple scattering

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Proceedings Article | 7 July 1998 Paper

Surface reflectance variations in realistic targets

David Thomas, Roger Evans, Jim Crosby, James Jafolla

Proceedings Volume 3375, (1998) https://doi.org/10.1117/12.327160

KEYWORDS: Reflectivity, Bidirectional reflectance transmission function, Data modeling, Visualization, Systems modeling, Process modeling, Near infrared, Statistical modeling, Modeling and simulation, Performance modeling

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Proceedings Article | 26 September 1997 Paper

Phenomenological BRDF modeling for engineering applications

James Jafolla, Jeffrey Stokes, Robert Sullivan

Proceedings Volume 3141, (1997) https://doi.org/10.1117/12.287800

KEYWORDS: Scattering, Bidirectional reflectance transmission function, Particles, High dynamic range imaging, Reflectivity, Light scattering, Electromagnetic scattering, Reflection, Optical coatings, Multiple scattering

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Proceedings Article | 20 June 1997 Paper

Bidirectional reflectance measurements for high-resolution signature modeling

David Thomas, James Jafolla, Peter Sarman

Proceedings Volume 3062, (1997) https://doi.org/10.1117/12.276667

KEYWORDS: Bidirectional reflectance transmission function, Reflectivity, Sensors, Light sources, Modeling and simulation, Calibration, Data modeling, Scattering, High dynamic range imaging, Light scattering

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Proceedings Article | 27 March 1997 Paper

Excimer micromachining for texturing silicon solar cells

Ugur Ortabasi, Daniel Meier, John Easoz, Ronald Schaeffer, Maria Stepanova, Wen Ho, Jeffrey Stokes, Richard Dummer, James Jafolla, Paul McKenna

Proceedings Volume 2993, (1997) https://doi.org/10.1117/12.270014

KEYWORDS: Silicon, Excimer lasers, Micromachining, Reflectivity, Excimers, Crystals, Solar cells, Semiconductor lasers, Silicon solar cells, Diamond

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Proceedings Article | 17 June 1996 Paper

Optical properties measurements, instrumentation, and analytical tools for interactive signature analysis of targets and backgrounds

William Kreiss, Richard Dummer, James Jafolla

Proceedings Volume 2742, (1996) https://doi.org/10.1117/12.243020

KEYWORDS: Extremely high frequency, Reflectivity, Optical coatings, Optical properties, Bidirectional reflectance transmission function, Infrared signatures, Sensors, Target detection, Palladium, Optical testing

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Proceedings Article | 12 February 1993 Paper

Bidirectional reflectance data to support paint development and signature calculations

Michael Beecroft, John Neu, James Jafolla

Proceedings Volume 1753, (1993) https://doi.org/10.1117/12.140711

KEYWORDS: Bidirectional reflectance transmission function, Reflectivity, Data modeling, Sensors, Infrared signatures, Computer simulations, Reflectometry, Solids, Optical properties, System on a chip

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Showing 5 of 13 publications

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