Dr. James S. Noble
at Univ of Missouri
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 February 2002 Paper
James Noble, Huay-Huay Lim
Proceedings Volume 4569, (2002) https://doi.org/10.1117/12.455275
KEYWORDS: Fractal analysis, Manufacturing, Statistical analysis, Algorithm development, Lead, Logic, Control systems, Product engineering, Digital signal processing, Packaging

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