Dr. Jeffery R. Price Profile

Dr. Jeffery R. Price

Research & Development Staff at Aldis, Inc.

SPIE Involvement:

Author

Proceedings Article | 3 April 2008 Paper

3D multispectral light propagation model for subcutaneous veins imaging

Vincent Paquit, Jeffery Price, Fabrice Mériaudeau, Kenneth Tobin

Proceedings Volume 6913, 69130D (2008) https://doi.org/10.1117/12.772825

KEYWORDS: 3D modeling, Skin, Monte Carlo methods, Absorption, Veins, Tissues, Scattering, 3D image processing, Photon transport, Blood

Read Abstract +

Proceedings Article | 29 May 2007 Paper

Optical spatial heterodyned interferometry for inspection of microelectromechanical systems

Kenneth Tobin, Philip Bingham, Jeffery Price

Proceedings Volume 6356, 63560G (2007) https://doi.org/10.1117/12.736740

KEYWORDS: Inspection, Microelectromechanical systems, Wavefronts, Interferometry, Photomasks, Semiconductors, Metrology, Semiconducting wafers, Holograms, Phase measurement

Read Abstract +

Proceedings Article | 21 March 2007 Paper

Combining near-infrared illuminants to optimize venous imaging

Vincent Paquit, Jeffery Price, Fabrice Mériaudeau, Kenneth Tobin, Thomas Ferrell

Proceedings Volume 6509, 65090H (2007) https://doi.org/10.1117/12.712576

KEYWORDS: Veins, Near infrared, Skin, Reflectivity, Cameras, Light emitting diodes, Principal component analysis, 3D modeling, Imaging systems, Calibration

Read Abstract +

Proceedings Article | 5 March 2007 Paper

Improvements in level set segmentation of 3D small animal imagery

Jeffery Price, Deniz Aykac, Jonathan Wall

Proceedings Volume 6512, 651233 (2007) https://doi.org/10.1117/12.709662

KEYWORDS: Image segmentation, Spleen, Blood, 3D image processing, Data modeling, Animal model studies, Lithium, X-ray computed tomography, Image processing, 3D modeling

Read Abstract +

Proceedings Article | 17 February 2007 Paper

Automatic characterization of cross-sectional coated particle nuclear fuel using greedy coupled Bayesian snakes

Jeffery Price, Deniz Aykac, John Hunn, Andrew Kercher

Proceedings Volume 6503, 650302 (2007) https://doi.org/10.1117/12.702759

KEYWORDS: Particles, Image analysis, Fourier transforms, Lead, Silicon carbide, Statistical analysis, Interfaces, Image resolution, Metrology, Digital imaging

Read Abstract +

Proceedings Article | 10 March 2006 Paper

Near-infrared imaging and structured light ranging for automatic catheter insertion

Vincent Paquit, Jeffery Price, Ralph Seulin, Fabrice Mériaudeau, Rubye Farahi, Kenneth Tobin, Thomas Ferrell

Proceedings Volume 6141, 61411T (2006) https://doi.org/10.1117/12.655326

KEYWORDS: Veins, Near infrared, 3D modeling, 3D image processing, Cameras, Skin, 3D acquisition, Light emitting diodes, Image processing, Structured light

Read Abstract +

Proceedings Article | 9 February 2006 Paper

New developments in image-based characterization of coated particle nuclear fuel

Jeffery Price, Deniz Aykac, John Hunn, Andrew Kercher, Robert Morris

Proceedings Volume 6070, 60700H (2006) https://doi.org/10.1117/12.647834

KEYWORDS: Particles, Image segmentation, Polishing, Image analysis, Surface finishing, Image processing, Coating, Epoxies, Spherical lenses, Lawrencium

Read Abstract +

SPIE Journal Paper | 1 July 2005 Open Access

Quantitative comparison of mitotic spindles by confocal image analysis

Jeffery Price, Deniz Aykac, Shaun Gleason, Karuna Chourey, Yie Liu

JBO, Vol. 10, Issue 04, 044012, (July 2005) https://doi.org/10.1117/12.10.1117/1.1955531

KEYWORDS: Spindles, Proteins, Confocal microscopy, Principal component analysis, Image analysis, 3D image processing, Image processing, Genetics, Analytical research, 3D modeling

Read Abstract +

DOWNLOAD PAPER

SPIE Journal Paper | 1 July 2004

Semiconductor sidewall shape estimation

Philip Bingham, Jeffery Price, Kenneth Tobin, Thomas Karnowski

JEI, Vol. 13, Issue 03, (July 2004) https://doi.org/10.1117/12.10.1117/1.1763586

KEYWORDS: Feature extraction, Scanning electron microscopy, Principal component analysis, Image processing, Databases, Semiconductors, Semiconducting wafers, Error analysis, Imaging systems, Process control

Read Abstract +

Proceedings Article | 3 May 2004 Paper

Optical inspection of coated-particle nuclear fuel

Jeffery Price, John Hunn

Proceedings Volume 5303, (2004) https://doi.org/10.1117/12.532393

KEYWORDS: Particles, Image resolution, Inspection, Image segmentation, Spherical lenses, Optical inspection, Silicon carbide, Image processing, Coating, Epoxies

Read Abstract +

Proceedings Article | 15 July 2003 Paper

Sidewall structure estimation from CD-SEM for lithographic process control

Philip Bingham, Jeffery Price, Kenneth Tobin, Thomas Karnowski, Marylyn Bennett, E. Hal Bogardus, Michael Bishop

Proceedings Volume 5041, (2003) https://doi.org/10.1117/12.485229

KEYWORDS: Scanning electron microscopy, Finite element methods, Feature extraction, Databases, Semiconducting wafers, Critical dimension metrology, Sensors, Lithography, Image retrieval, Electron beams

Read Abstract +

Proceedings Article | 22 May 2003 Paper

Estimating cross-section semiconductor structure by comparing top-down SEM images

Jeffery Price, Philip Bingham, Kenneth Tobin, Thomas Karnowski

Proceedings Volume 5011, (2003) https://doi.org/10.1117/12.479691

KEYWORDS: Semiconductors, Scanning electron microscopy, Principal component analysis, Feature extraction, Databases, Image processing, Lithography, Electron microscopes, Statistical analysis, Pattern recognition

Read Abstract +

Proceedings Article | 1 May 2003 Paper

Semiconductor sidewall shape estimation using top-down CD-SEM image retrieval

Jeffery Price, Philip Bingham, Kenneth Tobin, Thomas Karnowski

Proceedings Volume 5132, (2003) https://doi.org/10.1117/12.514963

KEYWORDS: Antimony, Feature extraction, Semiconductors, Principal component analysis, Image retrieval, Scanning electron microscopy, Databases, Image processing, Image analysis, Algorithm development

Read Abstract +

Proceedings Article | 1 May 2003 Paper

Detection of cavitation pits on steel surfaces using SEM imagery

Jeffery Price, Kathy Hylton, Kenneth Tobin, Philip Bingham, John Hunn, John Haines

Proceedings Volume 5132, (2003) https://doi.org/10.1117/12.515154

KEYWORDS: Scanning electron microscopy, Image processing, Sensors, Cavitation, Fourier transforms, Mercury, Image resolution, Liquids, Gaussian filters, Image storage

Read Abstract +

Proceedings Article | 13 April 2001 Paper

Superquadrics-based object representation of complex scenes from range images

Yan Zhang, Jeffery Price, Mongi Abidi

Proceedings Volume 4298, (2001) https://doi.org/10.1117/12.424914

KEYWORDS: 3D modeling, Image segmentation, Image registration, 3D image processing, Image processing algorithms and systems, 3D image reconstruction, Data modeling, Solids, Systems modeling, Visual process modeling

Read Abstract +

SPIE Journal Paper | 1 January 2001

Integration of multiple range and intensity image pairs using a volumetric method to create textured 3D models

W. Harvey Gray, Jeffery Price, Christophe Dumont, Mongi Abidi

JEI, Vol. 10, Issue 01, (January 2001) https://doi.org/10.1117/12.10.1117/1.1329340

Proceedings Article | 29 December 2000 Paper

Adaptive regularized image interpolation using data fusion and steerable constraints

Jeong-Ho Shin, Joon-Ki Paik, Jeffery Price, Mongi Abidi

Proceedings Volume 4310, (2000) https://doi.org/10.1117/12.411861

KEYWORDS: Image fusion, Image interpolation, Data fusion, Lawrencium, Image processing, Image resolution, Image restoration, Linear filtering, Gaussian filters, Image enhancement

Read Abstract +