Ms. Jenny Leung Profile

Jenny Leung

at Simon Fraser Univ

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Author

Publications (7)

Proceedings Article | 15 February 2012 Paper

Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO

Glenn Chapman, Jenny Leung, Rohit Thomas, Ana Namburete, Zahava Koren, Israel Koren

Proceedings Volume 8298, 82980E (2012) https://doi.org/10.1117/12.910096

KEYWORDS: Cameras, Sensors, CCD image sensors, Charge-coupled devices, CCD cameras, Imaging systems, Calibration, Picosecond phenomena, Image sensors, Control systems

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Proceedings Article | 17 February 2011 Paper

Tradeoffs in imager design parameters for sensor reliability

Glenn Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren

Proceedings Volume 7875, 78750I (2011) https://doi.org/10.1117/12.876947

KEYWORDS: Cameras, Sensors, CCD image sensors, CCD cameras, Calibration, Imaging systems, Image sensors, Photography, Picosecond phenomena, Reliability

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Proceedings Article | 26 January 2010 Paper

Analyzing the impact of ISO on digital imager defects with an automatic defect trace algorithm

Jenny Leung, Glenn Chapman, Yong Choi, Rohit Thomas, Israel Koren, Zahava Koren

Proceedings Volume 7536, 75360F (2010) https://doi.org/10.1117/12.839156

KEYWORDS: Cameras, Sensors, Calibration, CCD cameras, Imaging systems, Photography, CCD image sensors, Defect detection, Algorithm development, Image sensors

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Proceedings Article | 28 January 2009 Paper

The implementation and spectrum response analysis of multifinger photogate APS pixels

Jenny Leung, Michelle La Haye, Glenn Chapman, Jeff Liu, Phanindra Kalyanam, M. Parameswaran

Proceedings Volume 7249, 724903 (2009) https://doi.org/10.1117/12.806110

KEYWORDS: Absorption, Light emitting diodes, Silicon, Sensors, Calibration, Quantum efficiency, Transistors, Molybdenum, Capacitors, CMOS sensors

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Proceedings Article | 19 January 2009 Paper

Statistical identification and analysis of defect development in digital imagers

Jenny Leung, Glenn Chapman, Zahava Koren, Israel Koren

Proceedings Volume 7250, 72500W (2009) https://doi.org/10.1117/12.806109

KEYWORDS: Cameras, Sensors, Detection and tracking algorithms, Defect detection, Optical inspection, Imaging systems, CCD image sensors, Image sensors, Statistical analysis, Error analysis

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Proceedings Article | 17 October 2008 Paper

Effects of heated substrates on bimetallic thermal resist for lithography and grayscale photomask applications

James Dykes, Polly Tsui, Jenny Leung, Glenn Chapman

Proceedings Volume 7122, 71220M (2008) https://doi.org/10.1117/12.801560

KEYWORDS: Argon ion lasers, Photomasks, Laser systems engineering, Nd:YAG lasers, Transparency, Laser development, Objectives, Thin films, Sensors, Calibration

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Proceedings Article | 19 March 2008 Paper

Characterization of pixel defect development during digital imager lifetime

Jenny Leung, Jozsef Dudas, Glenn Chapman, Zahava Koren, Israel Koren

Proceedings Volume 6816, 68160A (2008) https://doi.org/10.1117/12.767011

KEYWORDS: Sensors, Cameras, Detection and tracking algorithms, Imaging systems, Algorithm development, Calibration, Image processing, Computer simulations, Error analysis, Statistical analysis

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Showing 5 of 7 publications

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