Prof. Jin Jang Profile

Prof. Jin Jang

at Kyung Hee Univ

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 18 August 2009 Paper

The effect of Mg and Si impurities on the optical property of InGaN-light emitting diode

Eun-Hyun Park, Jin Jang

Proceedings Volume 7422, 742203 (2009) https://doi.org/10.1117/12.829445

KEYWORDS: Magnesium, Silicon, Light emitting diodes, Doping, Quantum wells, Gallium nitride, Optical properties, Diffusion, Quantum dot light emitting diodes, Electroluminescence

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Proceedings Article | 25 August 2008 Paper

Materials for organic electronics: conductors and semiconductors designed for wet processing

Stephan Kirchmeyer, Timo Meyer-Friedrichsen, Andreas Elschner, Detlef Gaiser, Wilfried Lövenich, Friedrich Jonas, Sergei Ponomarenko, Jin Jang

Proceedings Volume 7054, 705402 (2008) https://doi.org/10.1117/12.794888

KEYWORDS: Transistors, Polymers, Printing, Semiconductors, Organic electronics, Organic semiconductors, Silicon, Electrodes, Dielectrics, Field effect transistors

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Proceedings Article | 16 October 2007 Paper

Self-assembled monolayer modification of PEDOT:PSS interface to improve the device performance in blue PLED

Yong Kyun Lee, Tae Jin Park, Woo Sik Jeon, Jung Joo Park, Jang Hyuk Kwon, Jin Jang

Proceedings Volume 6655, 66551E (2007) https://doi.org/10.1117/12.731980

KEYWORDS: Organic light emitting diodes, Silicon, Polymers, Chlorine, Self-assembled monolayers, Interfaces, Electroluminescence, Molecules, Excitons, Glasses

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Proceedings Article | 30 June 2000 Paper

High-performance thin film transistors using Ni silicide for liquid-crystal displays

Jin Jang, Jaiil Ryu, Kyu Cho

Proceedings Volume 4079, (2000) https://doi.org/10.1117/12.389391

KEYWORDS: Resistance, Nickel, Ions, Crystals, Amorphous silicon, Annealing, Capacitance, Silicon, Aluminum, Doping

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Proceedings Article | 19 June 1997 Paper

Modified low-temperture direct bonding method for vacuum microelectronics application

Byeong-Kwon Ju, Duck-Jung Lee, Woo-Beom Choi, Yun-Hi Lee, Jin Jang, Kwang-Bae Lee, Myung-Hwan Oh

Proceedings Volume 3046, (1997) https://doi.org/10.1117/12.276625

KEYWORDS: Semiconducting wafers, Glasses, Interfaces, Silicon, Wafer bonding, Ions, Sodium, Surface roughness, Microelectronics, Scanning electron microscopy

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