Mr. Jing-Wei Shih Profile

Jing-Wei Shih

at Synopsys Taiwan Co Ltd

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Publications (1)

Proceedings Article | 12 November 2024 Presentation + Paper

Manhattan and curvilinear mask error correction

Yung-Yu Chen, Chien-Yun Yang, Wen-Li Cheng, Jing-Wei Shih, Yu-Po Tang, John Valadez, Linghui Wu, Guangming Xiao

Proceedings Volume 13216, 132161M (2024) https://doi.org/10.1117/12.3034652

KEYWORDS: Contour modeling, Optical proximity correction, Distance measurement, Shape analysis, Error analysis, Target recognition, Mask making, Smoothing

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