Jiwei Tian
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 March 2015 Paper
Proceedings Volume 9446, 94462T (2015) https://doi.org/10.1117/12.2181193
KEYWORDS: Confocal microscopy, Calibration, Laser development, Laser systems engineering, Distance measurement, Metrology, Interferometers, Lenses, Precision measurement, Optical metrology

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