Tungsten and Molybdenum Disulfide flakes were investigated using tip-enhanced Raman spectroscopy, nanomechanical measurements and wide-field Raman Microscopy with Stochastic optical reconstruction Post processing.
These microscopy approaches are well adapted to understand how the surface of 2D materials develop and how their mechanical properties can reveal hidden structures leading to a better understanding of their formation.
Raman and luminescence Wide field microscopies with Stochastic optical reconstruction are also of interested to reveal photophysical processes at the edges of the flakes with a well adapted temporal resolution.
Here, we report on the development of a wide field Raman microscope which significantly improves the speed of acquisition at selected spectral range with spatial resolution in the range of ~200 nm over large field of view. This is achieved by analyzing small fluctuations in a large time-series of Raman images with a stochastic optical reconstruction microscopy (STORM) protocol in order to localize the molecules. We demonstrate the potential of this microscope by analyzing distinct samples such of patterned Silicon, polystyrene microspheres on Silicon wafer and graphene on Silicon/Silicon dioxide substrate.
We report on light induced reversible structuring of azobenzene containing polymer films under dynamic changes of the local distribution of the electrical field in the irradiating interference pattern. This is achieved utilizing a homemade setup which consists of three parts: a two-beam interference lithography for topography structuring, an atomic force microscope for in-situ recording (during irradiation) of surface morphology and a diffraction efficiency setup which enables to obtain information about the birefringence grating development simultaneously. Introducing a phase delay between the two interfering beams results in a shift of the whole interference pattern along the sample plane and subsequent change in topographical grating. In this way one can reversibly structure the surface topography in a controlled way and quite fast. On the other hand, this allows to erase the surface grating by just performing half period shift. Combining this method with a single beam exposure creates a very efficient way of completely erasing the birefringence and surface grating.
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