Dr. Joachim Jonuscheit Profile

Dr. Joachim Jonuscheit

Senior Scientist/Project Manager at Fraunhofer ITWM

SPIE Involvement:

Author

Proceedings Article | 7 March 2022 Presentation

Multilayer terahertz thickness imaging at 1.6-kHz pixel rate

Daniel Molter, Kim-Sophie Ellenberger, Jens Klier, Stefan Weber, Joachim Jonuscheit, Georg von Freymann, Nico Vieweg, Katja Dutzi, Anselm Deninger

Proceedings Volume PC12000, PC120000H (2022) https://doi.org/10.1117/12.2615320

KEYWORDS: Terahertz technology, Metals, Computing systems

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Proceedings Article | 30 March 2020 Presentation

Photonic terahertz technology for layer thickness measurements (Conference Presentation)

Daniel Molter, Jens Klier, Stefan Weber, Tobias Pfeiffer, Michael Kolano, Oliver Boidol, Mirco Kutas, Björn Haase, Joachim Jonuscheit, Georg von Freymann

Proceedings Volume 11348, 1134804 (2020) https://doi.org/10.1117/12.2553340

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SPIE Journal Paper | 21 March 2014

Nondestructive testing potential evaluation of a terahertz frequency-modulated continuous-wave imager for composite materials inspection

Edison Cristofani, Fabian Friederich, Sabine Wohnsiedler, Carsten Matheis, Joachim Jonuscheit, Marijke Vandewal, René Beigang

OE, Vol. 53, Issue 03, 031211, (March 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.3.031211

KEYWORDS: Terahertz radiation, Inspection, Sensors, Nondestructive evaluation, Spatial resolution, Composites, Continuous wave operation, Imaging systems, Solids, Lenses

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SPIE Journal Paper | 16 December 2013 Open Access

Aeronautics composite material inspection with a terahertz time-domain spectroscopy system

Frank Ospald, Wissem Zouaghi, Rene Beigang, Carsten Matheis, Joachim Jonuscheit, Benoit Recur, Jean-Paul Guillet, Patrick Mounaix, Wouter Vleugels, Pablo Bosom, Laura Gonzalez, Ion Lopez, Rafael Edo, Yehuda Sternberg, Marijke Vandewal

OE, Vol. 53, Issue 03, 031208, (December 2013) https://doi.org/10.1117/12.10.1117/1.OE.53.3.031208

KEYWORDS: Terahertz radiation, Composites, Terahertz spectroscopy, Inspection, Reflection, Spectroscopy, Sensors, Nondestructive evaluation, Photography, Picosecond phenomena

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Proceedings Article | 9 May 2012 Paper

Development and optimization of THz NDT on aeronautics composite multilayered structures

M. Vandewal, J. Depauw, K. Rombaut, R. Beigang, J. Jonuscheit, P. Mounaix, I. Sáez de Ocáriz, R. Martínez Edo, A. Priegue, Y. Sternberg

Proceedings Volume 8363, 83630Y (2012) https://doi.org/10.1117/12.928287

KEYWORDS: Terahertz radiation, Nondestructive evaluation, Composites, Sensors, Pulsed laser operation, Inspection, Signal detection, Transceivers, Structured optical fibers, Calibration

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Proceedings Article | 9 May 2012 Paper

A 3D THz image processing methodology for a fully integrated, semi-automatic and near real-time operational system

A. Brook, E. Cristofani, M. Vandewal, C. Matheis, J. Jonuscheit, R. Beigang

Proceedings Volume 8363, 83630E (2012) https://doi.org/10.1117/12.919382

KEYWORDS: Image processing, 3D image processing, Terahertz radiation, Image segmentation, Calibration, Sensors, Geometrical optics, Composites, Nondestructive evaluation, 3D acquisition

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Proceedings Article | 1 May 2009 Paper

Terahertz standoff identification: influence of environment and sample properties

Michael Herrmann, Sabine Wohnsiedler, Christian Wiegand, Michael Theuer, Joachim Jonuscheit, René Beigang

Proceedings Volume 7311, 731105 (2009) https://doi.org/10.1117/12.818436

KEYWORDS: Terahertz radiation, Humidity, Absorption, Reflection, Surface roughness, Terahertz spectroscopy, Spectroscopy, Temperature metrology, Dielectrics, Atmospheric modeling

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Proceedings Article | 12 February 2009 Paper

Simulation and experiment of terahertz stand-off detection

Sabine Wohnsiedler, Michael Theuer, Michael Herrmann, Shany Islam, Joachim Jonuscheit, René Beigang, Frank Hase

Proceedings Volume 7215, 72150H (2009) https://doi.org/10.1117/12.808871

KEYWORDS: Terahertz radiation, Humidity, Absorption, Terahertz spectroscopy, Surface roughness, Millimeter wave sensors, Surface properties, Atmospheric modeling, Reflection, Temperature metrology

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Showing 5 of 8 publications

Conference Committee Involvement (1)

Quantum Sensing and Nano Electronics and Photonics XXI

26 January 2025 | San Francisco, California, United States

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